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LAFARGE P
FILIPE A
ESTEVE D
DEVORET MH
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DEMURE B
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MIARA D
MILLET B
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PARINI A
PASTEAU MC
PICARD M
PUPPONI MM
QUINIO C
RAULET F
ROCCA ML
SZABASON F
TARDIEU MC
TOUATILUMBROSO A
TROUDET L
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Citation: Md. Rouhani et al., ATOMIC-SCALE SIMULATION OF INTERFACE DEFECT FORMATION IN THE INITIAL-STAGES OF THIN-FILM GROWTH, Thin solid films, 228(1-2), 1993, pp. 326-329
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Authors:
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LAFARGE P
ESTEVE D
URBINA C
DEVORET MH
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