Authors:
Benedic, F
Belmahi, H
Easwarakhanthan, T
Alnot, P
Citation: F. Benedic et al., In situ optical characterization during MPACVD diamond film growth on silicon substrates using a bichromatic infrared pyrometer under oblique incidence, J PHYS D, 34(7), 2001, pp. 1048-1058
Citation: T. Easwarakhanthan et P. Alnot, Simultaneous measurement of film and substrate optical parameters from multiple sample single wavelength ellipsometric data, EPJ-APPL PH, 6(3), 1999, pp. 285-292
Citation: T. Easwarakhanthan et P. Alnot, Measurement of the interface layer thickness in SiO2/Si structures by single-wavelength null ellipsometry, SURF INT AN, 26(13), 1998, pp. 1008-1015