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Results: 4

Authors: Pigeat, P Benedic, F Bonasso, N Rouxel, D Belmahi, M Easwarakhanthan, T Alnot, P Weber, B
Citation: P. Pigeat et al., Synthesis of diamond films: Control in situ by emission interferometry, VIDE, 56(300), 2001, pp. 346

Authors: Benedic, F Belmahi, H Easwarakhanthan, T Alnot, P
Citation: F. Benedic et al., In situ optical characterization during MPACVD diamond film growth on silicon substrates using a bichromatic infrared pyrometer under oblique incidence, J PHYS D, 34(7), 2001, pp. 1048-1058

Authors: Easwarakhanthan, T Alnot, P
Citation: T. Easwarakhanthan et P. Alnot, Simultaneous measurement of film and substrate optical parameters from multiple sample single wavelength ellipsometric data, EPJ-APPL PH, 6(3), 1999, pp. 285-292

Authors: Easwarakhanthan, T Alnot, P
Citation: T. Easwarakhanthan et P. Alnot, Measurement of the interface layer thickness in SiO2/Si structures by single-wavelength null ellipsometry, SURF INT AN, 26(13), 1998, pp. 1008-1015
Risultati: 1-4 |