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Results:
1-8
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Results: 8
Authors:
Teofilov, N
Thonke, K
Sauer, R
Ebling, DG
Kirste, L
Benz, KW
Citation: N. Teofilov et al., Near band-edge transitions in AlN thin films grown on different substrates, DIAM RELAT, 10(3-7), 2001, pp. 1300-1303
Authors:
Kirste, L
Ebling, DG
Haug, C
Brenn, R
Benz, KW
Tillmann, K
Citation: L. Kirste et al., Structural quality and ordering of MBE grown AlxGa1-xN-layers, MAT SCI E B, 82(1-3), 2001, pp. 9-11
Authors:
Ebling, DG
Kirste, L
Benz, KW
Teofilov, N
Thonke, K
Sauer, R
Citation: Dg. Ebling et al., Optical properties and ordering of AlxGa1-xN MBE-layers, J CRYST GR, 227, 2001, pp. 453-457
Authors:
Meincke, H
Ebling, DG
Heinze, J
Tacke, M
Bottner, H
Citation: H. Meincke et al., A photoelectrochemical study of anodic oxides on lead selenide surfaces inalkaline solutions, FRESEN J AN, 365(1-3), 1999, pp. 147-149
Authors:
Ebling, DG
Rattunde, M
Steinke, L
Benz, KW
Winnacker, A
Citation: Dg. Ebling et al., MBE of AlN on SiC and influence of structural substrate defects on epitaxial growth, J CRYST GR, 202, 1999, pp. 411-414
Authors:
Kornitzer, K
Limmer, W
Thonke, K
Sauer, R
Ebling, DG
Steinke, L
Benz, KW
Citation: K. Kornitzer et al., AlN on sapphire and on SiC: CL and Raman study, J CRYST GR, 202, 1999, pp. 441-443
Authors:
Winterhalter, J
Ebling, DG
Maier, D
Honerkamp, J
Citation: J. Winterhalter et al., Analysis of admittance data: Comparison of a parametric and a nonparametric method, J COMPUT PH, 153(1), 1999, pp. 139-159
Authors:
Link, A
Bitzer, K
Limmer, W
Sauer, R
Kirchner, C
Schwegler, V
Kamp, M
Ebling, DG
Benz, KW
Citation: A. Link et al., Temperature dependence of the E-2 and A(1)(LO) phonons in GaN and AlN, J APPL PHYS, 86(11), 1999, pp. 6256-6260
Risultati:
1-8
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