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Citation: S. Baunack et al., AES depth profiling multilayers of 3d transition metals, APPL SURF S, 179(1-4), 2001, pp. 25-29

Authors: Hecker, M Tietjen, D Elefant, D Schneider, CM Qiu, A Cramer, N Camley, RE Celinski, Z

Citation: M. Hecker et al., Thermally activated deterioration processes in Co/Cu GMR multilayers, J APPL PHYS, 89(11), 2001, pp. 7113-7115

Authors: Elefant, D Tietjen, D van Loyen, L Moench, I Schneider, CM

Citation: D. Elefant et al., Dominant role of the size effect for saturation resistivity and giant magnetoresistance in Co/Cu multilayers, J APPL PHYS, 89(11), 2001, pp. 7118-7120

Authors: van Loyen, L Elefant, D Tietjen, D Schneider, CM Hecker, M Thomas, J

Citation: L. Van Loyen et al., Annealing of Ni80Fe20/Cu and Co/Cu multilayers, J APPL PHYS, 87(9), 2000, pp. 4852-4854

Authors: Vaerst, G Loser, W Elefant, D Kucharkowski, R Michel, W Schultz, L

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Authors: Gorbunov, AA Tselev, AE Elefant, D Geisler, H Henninger, G Mensch, A Meyer, DC Wolf, B Paufler, P Pompe, W Schneider, CM Worch, H

Citation: Aa. Gorbunov et al., Thin film mixtures synthesized by cross-beam PLD, APPL PHYS A, 69, 1999, pp. S463-S466