Authors: Krieg, JF Neerman, CJ Savage, MW Titus, JL Emily, D Dunham, GW Van Vonno, N Swonger, J

Citation: Jf. Krieg et al., Comparison of total dose effects on a voltage reference fabricated on bonded-wafer and polysilicon dielectric isolation, IEEE NUCL S, 47(6), 2000, pp. 2561-2567

Authors: Titus, JL Emily, D Krieg, JF Turflinger, T Pease, RL Campbell, A

Citation: Jl. Titus et al., Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment, IEEE NUCL S, 46(6), 1999, pp. 1608-1615

Authors: Krieg, JF Titus, JL Emily, D Gehlhausen, M Swonger, J Platteter, D

Citation: Jf. Krieg et al., Enhanced low dose rate sensitivity (ELDRS) in a voltage comparator which only utilizes complementary vertical NPN and PNP transistors, IEEE NUCL S, 46(6), 1999, pp. 1616-1619

Authors: Krieg, J Turflinger, T Titus, J Cole, P Baker, P Gehlhausen, M Emily, D Yang, L Pease, RL Barnaby, H Schrimpf, R Maher, MC

Citation: J. Krieg et al., Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator, IEEE NUCL S, 46(6), 1999, pp. 1627-1632

Authors: Barnaby, HJ Schrimpf, RD Pease, RL Cole, P Turflinger, T Krieg, J Titus, J Emily, D Gehlhausen, M Witczak, SC Maher, MC Van Nort, D

Citation: Hj. Barnaby et al., Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response, IEEE NUCL S, 46(6), 1999, pp. 1666-1673

Authors: Pease, RL Gehlhausen, M Krieg, J Titus, J Turflinger, T Emily, D Cohn, L

Citation: Rl. Pease et al., Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS), IEEE NUCL S, 45(6), 1998, pp. 2665-2672