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Results: 10

Authors: Evangelou, EK Konofaos, N Aslanoglou, X Kennou, S Thomas, CB
Citation: Ek. Evangelou et al., Characterization of BaTiO3 thin films on p-Si, MAT SC S PR, 4(1-3), 2001, pp. 305-307

Authors: Konofaos, N Evangelou, EK Scholz, F Zieger, K Aperathitis, E
Citation: N. Konofaos et al., Electrical characterization and carrier transport mechanisms of GaAs p/i/ndevices for photovoltaic applications, MAT SCI E B, 80(1-3), 2001, pp. 152-155

Authors: Hastas, NA Dimitriadis, CA Logothetidis, S Angelis, CT Konofaos, N Evangelou, EK
Citation: Na. Hastas et al., Temperature dependence of the barrier at the tetrahedral amorphous carbon-silicon interface, SEMIC SCI T, 16(6), 2001, pp. 474-477

Authors: Konofaos, N Angelis, CT Evangelou, EK Dimitriadis, CA Logothetidis, S
Citation: N. Konofaos et al., Charge carrier response time in sputtered a-C/n-Si heterojunctions, APPL PHYS L, 79(15), 2001, pp. 2381-2383

Authors: Wang, ZC Kugler, V Helmersson, U Konofaos, N Evangelou, EK Nakao, S Jin, P
Citation: Zc. Wang et al., Electrical properties of SrTiO3 thin films on Si deposited by magnetron sputtering at low temperature, APPL PHYS L, 79(10), 2001, pp. 1513-1515

Authors: Konofaos, N Angelis, CT Evangelou, EK Panayiotatos, Y Dimitriadis, CA Logothetidis, S
Citation: N. Konofaos et al., Electrical characterization of TiN/a-C/Si devices grown by magnetron sputtering at room temperature, APPL PHYS L, 78(12), 2001, pp. 1682-1684

Authors: Evangelou, EK Konofaos, N Thomas, CB
Citation: Ek. Evangelou et al., Properties of barium titanate (BaTiO3) thin films grown on silicon by rf magnetron sputtering, PHIL MAG B, 80(3), 2000, pp. 395-407

Authors: Evangelou, EK Konofaos, N Craven, MR Cranton, WM Thomas, CB
Citation: Ek. Evangelou et al., Characterisation of the BaTiO3/p-Si interface and applications, APPL SURF S, 166(1-4), 2000, pp. 504-507

Authors: Evangelou, EK Konofaos, N Aslanoglou, XA Dimitriadis, CA Patsalas, P Logothetidis, S Kokkoris, M Kossionides, E Vlastou, R Groetschel, R
Citation: Ek. Evangelou et al., Characterization of magnetron sputtering deposited thin films of TiN for use as a metal electrode on TiN/SiO2/Si metal-oxide-semiconductor devices, J APPL PHYS, 88(12), 2000, pp. 7192-7196

Authors: Dimitriadis, CA Kamarinos, G Brini, J Evangelou, EK Gueorguiev, VK
Citation: Ca. Dimitriadis et al., Avalanche-induced excess noise in polycrystalline silicon thin-film transistors, APPL PHYS L, 74(1), 1999, pp. 108-110
Risultati: 1-10 |