AAAAAA

   
Results: 1-11 |
Results: 11
X-ray reflectivity of silicon on insulator wafers
Authors: Eymery, J Rieutord, F Fournel, F Buttard, D Moriceau, H
Citation: J. Eymery et al., X-ray reflectivity of silicon on insulator wafers, MAT SC S PR, 4(1-3), 2001, pp. 31-33
High-energy x-ray reflectivity of buried interfaces created by wafer bonding - art. no. 125408
Authors: Rieutord, F Eymery, J Fournel, F Buttard, D Oeser, R Plantevin, O Moriceau, H Aspar, B
Citation: F. Rieutord et al., High-energy x-ray reflectivity of buried interfaces created by wafer bonding - art. no. 125408, PHYS REV B, 6312(12), 2001, pp. 5408
Determination of residual stresses in grazing incidence - Synchrotron radiation
Authors: Sicardy, O Touet, I Rieutord, F Eymery, J
Citation: O. Sicardy et al., Determination of residual stresses in grazing incidence - Synchrotron radiation, J PHYS IV, 10(P10), 2000, pp. 103-113
Ultra thin silicon films directly bonded onto silicon wafers
Authors: Fournel, F Moriceau, H Magnea, N Eymery, J Rouviere, JL Rousseau, K Aspar, B
Citation: F. Fournel et al., Ultra thin silicon films directly bonded onto silicon wafers, MAT SCI E B, 73(1-3), 2000, pp. 42-46
Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
Authors: Buttard, D Eymery, J Rieutord, F Fournel, F Lubbert, D Baumbach, T Moriceau, H
Citation: D. Buttard et al., Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces, PHYSICA B, 283(1-3), 2000, pp. 103-107
Nanometric patterning with ultrathin twist bonded silicon wafers
Authors: Fournel, F Moriceau, H Magnea, N Eymery, J Buttard, D Rouviere, JL Rousseau, K Aspar, B
Citation: F. Fournel et al., Nanometric patterning with ultrathin twist bonded silicon wafers, THIN SOL FI, 380(1-2), 2000, pp. 10-14
Interface dilution and morphology of CdTe/MnTe superlattices studied by small- and large-angle x-ray scattering
Authors: Eymery, J Hartmann, JM Baumbach, GT
Citation: J. Eymery et al., Interface dilution and morphology of CdTe/MnTe superlattices studied by small- and large-angle x-ray scattering, J APPL PHYS, 87(10), 2000, pp. 7266-7274
Equilibrium shape of steps and islands on polar II-VI semiconductors surfaces
Authors: Martrou, D Eymery, J Magnea, N
Citation: D. Martrou et al., Equilibrium shape of steps and islands on polar II-VI semiconductors surfaces, PHYS REV L, 83(12), 1999, pp. 2366-2369
Large and small angle x-ray scattering studies of CdTe/MgTe superlattices
Authors: Hartmann, JM Eymery, J Carbonell, L Wang, Y
Citation: Jm. Hartmann et al., Large and small angle x-ray scattering studies of CdTe/MgTe superlattices, J APPL PHYS, 86(4), 1999, pp. 1951-1957
Localized destructive interference in X-ray specular reflectivity
Authors: Eymery, J
Citation: J. Eymery, Localized destructive interference in X-ray specular reflectivity, J APPL CRYS, 32, 1999, pp. 859-863
X-ray reflectivity of ultrathin twist-bonded silicon wafers
Authors: Eymery, J Fournel, F Rieutord, F Buttard, D Moriceau, H Aspar, B
Citation: J. Eymery et al., X-ray reflectivity of ultrathin twist-bonded silicon wafers, APPL PHYS L, 75(22), 1999, pp. 3509-3511
Risultati: 1-11 |