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Results:
1-7
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Results: 7
Authors:
HOUMMADY M
ROCHAT E
FARNAULT E
Citation: M. Hoummady et al., NONLINEAR TIP-SAMPLE INTERACTIONS AFFECTING FREQUENCY RESPONSES OF MICROCANTILEVERS IN TAPPING MODE ATOMIC-FORCE MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 935-938
Authors:
HOUMMADY M
FARNAULT E
Citation: M. Hoummady et E. Farnault, ENHANCED SENSITIVITY TO FORCE GRADIENTS BY USING HIGHER FLEXURAL MODES OF THE ATOMIC-FORCE MICROSCOPE CANTILEVER, Applied physics A: Materials science & processing, 66, 1998, pp. 361-364
Authors:
BUCHAILLOT L
FARNAULT E
HOUMMADY M
FUJITA H
Citation: L. Buchaillot et al., SILICON-NITRIDE THIN-FILMS YOUNGS MODULUS DETERMINATION BY AN OPTICALNON DESTRUCTIVE METHOD, JPN J A P 2, 36(6B), 1997, pp. 794-797
Authors:
HOUMMADY M
FARNAULT E
YAHIRO T
KAWAKATSU H
Citation: M. Hoummady et al., SIMULTANEOUS OPTICAL-DETECTION TECHNIQUES, INTERFEROMETRY, AND OPTICAL BEAM DEFLECTION FOR DYNAMIC-MODE CONTROL OF SCANNING FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1539-1542
Authors:
HOUMMADY M
FARNAULT E
FUJITA H
KAWAKATSU H
MASUZAWA T
Citation: M. Hoummady et al., NEW TECHNIQUE FOR NANOCANTILEVER FABRICATION BASED ON LOCAL ELECTROCHEMICAL ETCHING - APPLICATIONS TO SCANNING FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1556-1558
Authors:
FARNAULT E
CRETIN B
Citation: E. Farnault et B. Cretin, DISTANCE CONTROL OF A THERMOELASTIC PROBE USING OPTICAL-FIBER, Progress in Natural Science, 6, 1996, pp. 731-734
Authors:
CRETIN B
FRANQUET O
FARNAULT E
HAUDEN D
LESNE JL
Citation: B. Cretin et al., THERMOELASTIC IMAGING USING OPTICAL INTERFEROMETER - SENSITIVITY OPTIMIZATION AND SUPERRESOLUTION, Journal de physique. IV, 4(C7), 1994, pp. 7-10
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1-7
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