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Results: 1-11 |
Results: 11
LINEAR MEASUREMENTS ON SEM OF ELEMENTS WI TH TRAPEZOID STRUCTURE WITHDIFFERENT ENERGIES OF ELECTRONS OF A PROBE
Authors: NOVIKOV YA RAKOV AV FILIPPOV MN
Citation: Ya. Novikov et al., LINEAR MEASUREMENTS ON SEM OF ELEMENTS WI TH TRAPEZOID STRUCTURE WITHDIFFERENT ENERGIES OF ELECTRONS OF A PROBE, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(3), 1998, pp. 543-548
AN ECOLOGICAL SAFETY TECHNOLOGY AND ELECT RON-MICROSCOPY INVESTIGATION OF SIC THICK-FILMS STRUCTURE AND COMPOSITION
Authors: BATOV DV ELUTIN AV IVANOV LS PETROV VI STEPOVICH MA FILIPPOV MN
Citation: Dv. Batov et al., AN ECOLOGICAL SAFETY TECHNOLOGY AND ELECT RON-MICROSCOPY INVESTIGATION OF SIC THICK-FILMS STRUCTURE AND COMPOSITION, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(3), 1998, pp. 565-569
DETERMINATION OF LIGHT-ELEMENTS IN ELECTR ON-PROBE MICROANALYSIS
Authors: KUPRIYANOVA TA FILIPPOV MN
Citation: Ta. Kupriyanova et Mn. Filippov, DETERMINATION OF LIGHT-ELEMENTS IN ELECTR ON-PROBE MICROANALYSIS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(3), 1998, pp. 627-634
THE OPTICAL-PROPERTIES OF REGULAR MICROPOROUS MEMBRANES
Authors: MITROFANOV AV ZHITNIK IA FILIPPOV MN MAKAROV OA MEZENTSEVA LA NAZMOV VP PINDYURIN VF
Citation: Av. Mitrofanov et al., THE OPTICAL-PROPERTIES OF REGULAR MICROPOROUS MEMBRANES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 405(2-3), 1998, pp. 319-322
SALT DOPING IN ELECTRONPROBE MICROANALYSIS
Authors: GUIMELFARB FA FILIPPOV MN KLETSKINA EV
Citation: Fa. Guimelfarb et al., SALT DOPING IN ELECTRONPROBE MICROANALYSIS, Fresenius' journal of analytical chemistry, 357(7), 1997, pp. 796-800
A COMBINED INVESTIGATION OF CONNECTION BE TWEEN LOCAL PROPERTIES, CONDITIONS OF FABRICATION AND LUMINESCENT CHARACTERISTICS OF LIGHT-EMITTING-DIODES ON THE BASE OF EPY STRUCTURES GAAS-ALAS
Authors: ASTAKHOV VP KARPOV VV MARAKHONOV VM PETROV VI STEPOVITCH MA FILIPPOV MN TERRA FS
Citation: Vp. Astakhov et al., A COMBINED INVESTIGATION OF CONNECTION BE TWEEN LOCAL PROPERTIES, CONDITIONS OF FABRICATION AND LUMINESCENT CHARACTERISTICS OF LIGHT-EMITTING-DIODES ON THE BASE OF EPY STRUCTURES GAAS-ALAS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 60(2), 1996, pp. 22-26
CATHODOLUMINESCENCE LOCAL ANALYSIS OF SEM ICONDUCTOR HETEROSTRUCTURESON THE BASIS OF THE GAAS-ALAS SYSTEM
Authors: EGORENKOV OA FILIPPOV MN DUNAEV SF
Citation: Oa. Egorenkov et al., CATHODOLUMINESCENCE LOCAL ANALYSIS OF SEM ICONDUCTOR HETEROSTRUCTURESON THE BASIS OF THE GAAS-ALAS SYSTEM, Vestnik Moskovskogo universiteta. Seria 2. Himia, 36(5), 1995, pp. 447-452
SCANNING ANALYTICAL MICROSCOPY OF MULTILA YER SEMICONDUCTOR HETEROSTRUCTURES
Authors: DUNAEV SF EGORENKOV OA FILIPPOV MN
Citation: Sf. Dunaev et al., SCANNING ANALYTICAL MICROSCOPY OF MULTILA YER SEMICONDUCTOR HETEROSTRUCTURES, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 59(2), 1995, pp. 2-7
ELECTRON-PROBE MICROANALYSIS WITH AGAROSE COVER
Authors: GIMELFARB FA KLYOTSKINA EV FILIPPOV MN ALIMOVA AN SUSLOV GS
Citation: Fa. Gimelfarb et al., ELECTRON-PROBE MICROANALYSIS WITH AGAROSE COVER, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 59(2), 1995, pp. 64-69
EVALUATION OF ELECTRON-PROBE THERMAL ACTI ON IN SCANNING ELECTRON-MICROSCOPY AND ELECTRON-PROBE MICROANALYSIS
Authors: FILIPPOV MN
Citation: Mn. Filippov, EVALUATION OF ELECTRON-PROBE THERMAL ACTI ON IN SCANNING ELECTRON-MICROSCOPY AND ELECTRON-PROBE MICROANALYSIS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 57(8), 1993, pp. 165-171
ELECTRON PROVE MICROANALYSIS OF FROZEN LI QUIDS AND SUSPENSIONS
Authors: GIMELFARB FA FILIPPOV MN KLETZKINA EV
Citation: Fa. Gimelfarb et al., ELECTRON PROVE MICROANALYSIS OF FROZEN LI QUIDS AND SUSPENSIONS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 57(8), 1993, pp. 172-175
Risultati: 1-11 |