Authors: BESSER PR MARIEB TN LEE J FLINN PA BRAVMAN JC

Citation: Pr. Besser et al., MEASUREMENT AND INTERPRETATION OF STRAIN RELAXATION IN PASSIVATED AL-0.5-PERCENT CU LINES, Journal of materials research, 11(1), 1996, pp. 184-193

Authors: FLINN PA

Citation: Pa. Flinn, MECHANICAL-STRESS IN VLSI INTERCONNECTIONS - ORIGINS, EFFECTS, MEASUREMENT, AND MODELING, MRS bulletin, 20(11), 1995, pp. 70-73

Authors: BADER S FLINN PA ARZT E NIX WD

Citation: S. Bader et al., MECHANICAL STRENGTH AND MICROSTRUCTURE OF OXYGEN ION-IMPLANTED AL FILMS, Journal of materials research, 9(2), 1994, pp. 318-327

Authors: FLINN PA MADDEN MC MARIEB TN

Citation: Pa. Flinn et al., IN-SITU SEM OBSERVATIONS OF ELECTROMIGRATION VOIDS IN AL LINES UNDER PASSIVATION, MRS bulletin, 19(6), 1994, pp. 51-55

Authors: FLINN PA MACK AS BESSER PR MARIEB TN

Citation: Pa. Flinn et al., STRESS-INDUCED VOID FORMATION IN METAL LINES, MRS bulletin, 18(12), 1993, pp. 26-35