Authors:
WARWICK T
ADE H
CERASARI S
DENLINGER J
FRANCK K
GARCIA A
HAYAKAWA S
HITCHCOCK A
KIKUMA J
KLINGLER S
KORTRIGHT J
MORISSON G
MORONNE M
RIGHTOR E
ROTENBERG E
SEAL S
SHIN HJ
STEELE WF
TONNER BP
Citation: T. Warwick et al., DEVELOPMENT OF SCANNING-X-RAY MICROSCOPES FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE, Journal of synchrotron radiation, 5, 1998, pp. 1090-1092
Authors:
WARWICK T
FRANCK K
KORTRIGHT JB
MEIGS G
MORONNE M
MYNENI S
ROTENBERG E
SEAL S
STEELE WF
ADE H
GARCIA A
CERASARI S
DELINGER J
HAYAKAWA S
HITCHCOCK AP
TYLISZCZAK T
KIKUMA J
RIGHTOR EG
SHIN HJ
TONNER BP
Citation: T. Warwick et al., A SCANNING-TRANSMISSION X-RAY MICROSCOPE FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE, Review of scientific instruments, 69(8), 1998, pp. 2964-2973
Authors:
GOZZO F
FRANCK K
HOWELLS MR
HUSSAIN Z
WARWICK A
PADMORE HA
TRIPLETT BB
Citation: F. Gozzo et al., SOFT-X-RAY SPECTROMICROSCOPY AND ITS APPLICATION TO SEMICONDUCTOR MICROSTRUCTURE CHARACTERIZATION, Acta Physica Polonica. A, 91(4), 1997, pp. 697-705