Authors: WARWICK T ADE H CERASARI S DENLINGER J FRANCK K GARCIA A HAYAKAWA S HITCHCOCK A KIKUMA J KLINGLER S KORTRIGHT J MORISSON G MORONNE M RIGHTOR E ROTENBERG E SEAL S SHIN HJ STEELE WF TONNER BP

Citation: T. Warwick et al., DEVELOPMENT OF SCANNING-X-RAY MICROSCOPES FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE, Journal of synchrotron radiation, 5, 1998, pp. 1090-1092

Authors: WARWICK T FRANCK K KORTRIGHT JB MEIGS G MORONNE M MYNENI S ROTENBERG E SEAL S STEELE WF ADE H GARCIA A CERASARI S DELINGER J HAYAKAWA S HITCHCOCK AP TYLISZCZAK T KIKUMA J RIGHTOR EG SHIN HJ TONNER BP

Citation: T. Warwick et al., A SCANNING-TRANSMISSION X-RAY MICROSCOPE FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE, Review of scientific instruments, 69(8), 1998, pp. 2964-2973

Authors: GOZZO F FRANCK K HOWELLS MR HUSSAIN Z WARWICK A PADMORE HA TRIPLETT BB

Citation: F. Gozzo et al., SOFT-X-RAY SPECTROMICROSCOPY AND ITS APPLICATION TO SEMICONDUCTOR MICROSTRUCTURE CHARACTERIZATION, Acta Physica Polonica. A, 91(4), 1997, pp. 697-705