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Results: 1-19 |
Results: 19
LDPE PLASTICIZED STARCH BLENDS CONTAINING PE-G-MA COPOLYMER AS COMPATIBILIZER/
Authors: BIKIARIS D PRINOS J KOUTSOPOULOS K VOUROUTZIS N PAVLIDOU E FRANGIS N PANAYIOTOU C
Citation: D. Bikiaris et al., LDPE PLASTICIZED STARCH BLENDS CONTAINING PE-G-MA COPOLYMER AS COMPATIBILIZER/, Polymer degradation and stability, 59(1-3), 1998, pp. 287-291
PRODUCTION AND TREATMENT OF SI1-XGEX FILMS BY EXCIMER-LASER ASSISTED TECHNIQUES
Authors: CASTRO J CHIUSSI S SERRA J LEON B PEREZAMOR M MARTELLI S LARCIPRETE R FRANGIS N
Citation: J. Castro et al., PRODUCTION AND TREATMENT OF SI1-XGEX FILMS BY EXCIMER-LASER ASSISTED TECHNIQUES, Revista de metalurgia, 34(2), 1998, pp. 78-81
STRUCTURAL AND MICROSTRUCTURAL ASPECTS OF SI-X(TA,NB)TE-2
Authors: FRANGIS N VANTENDELOO G MANOLIKAS C AMELINCKX S
Citation: N. Frangis et al., STRUCTURAL AND MICROSTRUCTURAL ASPECTS OF SI-X(TA,NB)TE-2, Journal of solid state chemistry (Print), 139(1), 1998, pp. 105-123
HIGH-RESOLUTION ELECTRON-MICROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF HETEROEPITAXIAL SIXGE(1-X) ALLOYS PRODUCED THROUGH LASER-INDUCED PROCESSING
Authors: FRANGIS N VANLANDUYT J LARCIPRETE R MARTELLI S BORSELLA E CHIUSSI S CASTRO J LEON B
Citation: N. Frangis et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF HETEROEPITAXIAL SIXGE(1-X) ALLOYS PRODUCED THROUGH LASER-INDUCED PROCESSING, Applied physics letters, 72(22), 1998, pp. 2877-2879
UNPINNING OF THE FERMI-LEVEL AT ERBIUM SILICIDE SILICON INTERFACES
Authors: MURET P TAN TAN FRANGIS N VANLANDUYT J
Citation: P. Muret et al., UNPINNING OF THE FERMI-LEVEL AT ERBIUM SILICIDE SILICON INTERFACES, Physical review. B, Condensed matter, 56(15), 1997, pp. 9286-9289
MICROSTRUCTURE OF MN-DOPED, SPIN-CAST FESI2
Authors: MORIMURA T FRANGIS N VANTENDELOO G VANLANDUYT J HASAKA M HISATSUNE K
Citation: T. Morimura et al., MICROSTRUCTURE OF MN-DOPED, SPIN-CAST FESI2, Journal of Electron Microscopy, 46(3), 1997, pp. 221-225
THE FORMATION OF 3C-SIC IN CRYSTALLINE SI BY CARBON IMPLANTATION AT 950-DEGREES-C AND ANNEALING - A STRUCTURAL STUDY
Authors: FRANGIS N STOEMENOS J VANLANDUYT J NEJIM A HEMMENT PLF
Citation: N. Frangis et al., THE FORMATION OF 3C-SIC IN CRYSTALLINE SI BY CARBON IMPLANTATION AT 950-DEGREES-C AND ANNEALING - A STRUCTURAL STUDY, Journal of crystal growth, 181(3), 1997, pp. 218-228
GROWTH OF ERBIUM-SILICIDE FILMS ON (100)SILICON AS CHARACTERIZED BY ELECTRON-MICROSCOPY AND DIFFRACTION
Authors: FRANGIS N VANLANDUYT J KALTSAS G TRAVLOS A NASSIOPOULOS AG
Citation: N. Frangis et al., GROWTH OF ERBIUM-SILICIDE FILMS ON (100)SILICON AS CHARACTERIZED BY ELECTRON-MICROSCOPY AND DIFFRACTION, Journal of crystal growth, 172(1-2), 1997, pp. 175-182
AMORPHIZATION AND DEFECT RECOMBINATION IN ION-IMPLANTED SILICON-CARBIDE
Authors: GRIMALDI MG CALCAGNO L MUSUMECI P FRANGIS N VANLANDUYT J
Citation: Mg. Grimaldi et al., AMORPHIZATION AND DEFECT RECOMBINATION IN ION-IMPLANTED SILICON-CARBIDE, Journal of applied physics, 81(11), 1997, pp. 7181-7185
STRUCTURAL CHARACTERIZATION OF ERBIUM SILICIDE THIN-FILMS ON AN SI(111) SUBSTRATE
Authors: FRANGIS N VANTENDELOO G VANLANDUYT J MURET P NGUYEN TTA
Citation: N. Frangis et al., STRUCTURAL CHARACTERIZATION OF ERBIUM SILICIDE THIN-FILMS ON AN SI(111) SUBSTRATE, Journal of alloys and compounds, 234(2), 1996, pp. 244-250
HIGH CRYSTALLINE QUALITY ERBIUM SILICIDE FILMS ON (100)SILICON, GROWNIN HIGH-VACUUM
Authors: KALTSAS G TRAVLOS A NASSIOPOULOS AG FRANGIS N VANLANDUYT J
Citation: G. Kaltsas et al., HIGH CRYSTALLINE QUALITY ERBIUM SILICIDE FILMS ON (100)SILICON, GROWNIN HIGH-VACUUM, Applied surface science, 102, 1996, pp. 151-155
ELECTRON-MICROSCOPY CHARACTERIZATION OF ERBIUM SILICIDE THIN-FILMS GROWN ON A SI(111) SUBSTRATE
Authors: FRANGIS N VANTENDELOO G VANLANDUYT J MURET P NGUYEN TTA
Citation: N. Frangis et al., ELECTRON-MICROSCOPY CHARACTERIZATION OF ERBIUM SILICIDE THIN-FILMS GROWN ON A SI(111) SUBSTRATE, Applied surface science, 102, 1996, pp. 163-168
PHOTOELECTRIC AND ELECTRICAL RESPONSES OF SEVERAL ERBIUM SILICIDE SILICON INTERFACES/
Authors: MURET P NGUYEN TTA FRANGIS N VANTENDELOO G VANLANDUYT J
Citation: P. Muret et al., PHOTOELECTRIC AND ELECTRICAL RESPONSES OF SEVERAL ERBIUM SILICIDE SILICON INTERFACES/, Applied surface science, 102, 1996, pp. 173-177
ELECTRON-MICROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY CHARACTERIZATION OF 6H SIC SAMPLES IMPLANTED WITH HE+
Authors: FRANGIS N VANLANDUYT J GRIMALDI MG CALCAGNO L
Citation: N. Frangis et al., ELECTRON-MICROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY CHARACTERIZATION OF 6H SIC SAMPLES IMPLANTED WITH HE+, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 120(1-4), 1996, pp. 186-189
ION-BEAM SYNTHESIS OF BETA-SIC AT 950-DEGREES-C AND STRUCTURAL CHARACTERIZATION
Authors: FRANGIS N NEJIM A HEMMENT PLF STOEMENOS J VANLANDUYT J
Citation: N. Frangis et al., ION-BEAM SYNTHESIS OF BETA-SIC AT 950-DEGREES-C AND STRUCTURAL CHARACTERIZATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 325-329
NEW ERBIUM SILICIDE SUPERSTRUCTURES - A STUDY BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
Authors: FRANGIS N VANTENDELOO G VANLANDUYT J KALTSAS G TRAVLOS A NASSIOPOULOS AG
Citation: N. Frangis et al., NEW ERBIUM SILICIDE SUPERSTRUCTURES - A STUDY BY HIGH-RESOLUTION ELECTRON-MICROSCOPY, Physica status solidi. a, Applied research, 158(1), 1996, pp. 107-116
ELECTRON-MICROSCOPY CHARACTERIZATION OF TIN FILMS ON SI, GROWN BY DC-REACTIVE MAGNETRON SPUTTERING
Authors: PECZ B FRANGIS N LOGOTHETIDIS S ALEXANDROU I BARNA PB STOEMENOS J
Citation: B. Pecz et al., ELECTRON-MICROSCOPY CHARACTERIZATION OF TIN FILMS ON SI, GROWN BY DC-REACTIVE MAGNETRON SPUTTERING, Thin solid films, 268(1-2), 1995, pp. 57-63
TITANIUM DISILICIDE ON SILICON BY INTERDIFFUSION OF TITANIUM AND AMORPHOUS-SILICON MULTILAYERS - TRANSMISSION ELECTRON-MICROSCOPY, SPECTROSCOPIC ELLIPSOMETRY AND RESISTIVITY MEASUREMENTS
Authors: NASSIOPOULOS AG TAMBOURIS D FRANGIS N LOGOTHETIDIS S GEORGA S KRONTIRAS C XANTHOPOULOS N
Citation: Ag. Nassiopoulos et al., TITANIUM DISILICIDE ON SILICON BY INTERDIFFUSION OF TITANIUM AND AMORPHOUS-SILICON MULTILAYERS - TRANSMISSION ELECTRON-MICROSCOPY, SPECTROSCOPIC ELLIPSOMETRY AND RESISTIVITY MEASUREMENTS, Thin solid films, 247(1), 1994, pp. 44-50
PERFORMANCE OF GAXIN1-XP GAAS HETEROJUNCTIONS GROWN BY METAL-ORGANIC MOLECULAR-BEAM EPITAXY AND METAL-ORGANIC VAPOR-PHASE EPITAXY/
Authors: GINOUDI A PALOURA EC FRANGIS N
Citation: A. Ginoudi et al., PERFORMANCE OF GAXIN1-XP GAAS HETEROJUNCTIONS GROWN BY METAL-ORGANIC MOLECULAR-BEAM EPITAXY AND METAL-ORGANIC VAPOR-PHASE EPITAXY/, Journal of applied physics, 75(6), 1994, pp. 2980-2987
Risultati: 1-19 |