Authors:
UHLIG H
FRIESS M
DURR J
BELLISSENT R
LAMPARTER HP
ALDINGER F
STEEB S
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Authors:
KAISER G
MEYER A
FRIESS M
RIEDEL R
HARRIS I
JACOB E
Citation: G. Kaiser et al., CRITICAL COMPARISON OF ICP-OES, XRF AND FLUORINE VOLATILIZATION-FTIR SPECTROMETRY FOR THE RELIABLE DETERMINATION OF THE SILICON MAIN CONSTITUENT IN CERAMIC MATERIALS, Fresenius' journal of analytical chemistry, 352(3-4), 1995, pp. 318-326