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Authors:
Touboul, E
Buffat, L
Belkacemi, Y
Lefranc, JP
Uzan, S
Lhuillier, P
Faivre, C
Huart, J
Lotz, JP
Antoine, M
Pene, F
Blondon, J
Izrael, V
Laugier, A
Schlienger, M
Housset, M
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Citation: C. Faivre et D. Bellet, Structural properties of p(+)-type porous silicon layers versus the substrate orientation: an X-ray diffraction comparative study, J APPL CRYS, 32, 1999, pp. 1134-1144
Authors:
Faivre, C
Rougier, P
Ducreux, M
Mitry, E
Lusinchi, A
Lasser, P
Elias, D
Eschwege, F
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