Authors: Golshan, M Fewster, PF Andrew, NL Kidd, P Moore, M Butler, JE

Citation: M. Golshan et al., Three-dimensional reciprocal-space mapping of chemical vapour deposited diamond, J PHYS D, 34(10A), 2001, pp. A44-A46

Authors: Fewster, PF Andrew, NL Foxon, CT

Citation: Pf. Fewster et al., Microstructure and composition analysis of group III nitrides by X-ray scattering, J CRYST GR, 230(3-4), 2001, pp. 398-404

Authors: Fewster, PF Andrew, NL Hughes, OH Staddon, C Foxon, CT Bell, A Cheng, TS Wang, T Sakai, S Jacobs, K Moerman, I

Citation: Pf. Fewster et al., X-ray studies of group III-nitride quantum wells with high quality interfaces, J VAC SCI B, 18(4), 2000, pp. 2300-2303

Authors: Fewster, PF

Citation: Pf. Fewster, Thin films and multilayers, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 777-791

Authors: Fewster, PF

Citation: Pf. Fewster, Absolute lattice parameter measurement, J MAT S-M E, 10(3), 1999, pp. 175-183