Authors:
Cassette, S
Delage, SL
Chartier, E
Floriot, D
Poisson, MA
Garcia, JC
Grattepain, C
Arroyo, JM
Plana, R
Bland, SW
Citation: S. Cassette et al., Hydrogen-related effects in GaInP/GaAs HBTs: incorporation, removal and influence on device reliability, MAT SCI E B, 80(1-3), 2001, pp. 279-283
Authors:
Sydlo, C
Mottet, B
Ganis, H
Hartnagel, HL
Krozer, V
Delage, SL
Cassette, S
Chartier, E
Floriot, D
Citation: C. Sydlo et al., Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaPHBT, MICROEL REL, 41(9-10), 2001, pp. 1567-1571
Authors:
Arnaud, C
Barataud, D
Nebus, JM
Teyssier, JP
Villotte, JP
Floriot, D
Citation: C. Arnaud et al., An active pulsed RF and pulsed DC load-pull system for the characterization of HBT power amplifiers used in coherent radar and communication systems, IEEE MICR T, 48(12), 2000, pp. 2625-2629
Authors:
Girardot, A
Henkel, A
Delage, SL
Diforte-Poisson, MA
Chartier, E
Floriot, D
Cassette, S
Rolland, PA
Citation: A. Girardot et al., High-performance collector-up InGaP/GaAs heterojunction bipolar transistorwith Schottky contact, ELECTR LETT, 35(8), 1999, pp. 670-672