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Results:
1-10
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Results: 10
Authors:
Schweitz, KO
Bottiger, J
Greer, AL
Thomas, PJ
Foord, DT
Citation: Ko. Schweitz et al., The mechanism of degradation of Ag/Ni multilayers deposited at different temperatures, PHIL MAG A, 81(1), 2001, pp. 1-10
Authors:
Corbett, MH
Bowman, RM
Gregg, JM
Foord, DT
Citation: Mh. Corbett et al., Enhancement of dielectric constant and associated coupling of polarizationbehavior in thin film relaxor superlattices, APPL PHYS L, 79(6), 2001, pp. 815-817
Authors:
Quinton, WAJ
Liang, WY
Baudenbacher, F
Foord, DT
Bramley, AP
Newcomb, SB
Citation: Waj. Quinton et al., The microstructure of YBa2Cu3O7-delta films and yttria stabilised zirconiabuffer layers deposited on inclined hastelloy substrates, IEEE APPL S, 9(2), 1999, pp. 1498-1501
Authors:
Larson, DJ
Foord, DT
Petford-Long, AK
Cerezo, A
Smith, GDW
Citation: Dj. Larson et al., Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures, NANOTECHNOL, 10(1), 1999, pp. 45-50
Authors:
Rycroft, SFWR
Doyle, RA
Fuchs, DT
Zeldov, E
Drost, RJ
Kes, PH
Tamegai, T
Ooi, S
Campbell, AM
Liang, WY
Foord, DT
Citation: Sfwr. Rycroft et al., Effect of surface barriers on transport properties of Bi2Sr2CaCu2O8 singlecrystals using the Corbino disc configuration, SUPERCOND S, 12(12), 1999, pp. 1067-1070
Authors:
Winkler, D
Mros, N
Tarte, EJ
Yurgens, A
Krasnov, VM
Foord, DT
Booij, WE
Blamire, MG
Citation: D. Winkler et al., Intrinsic Josephson effects in submicrometre Bi2212 mesas fabricated by using focused ion beam etching, SUPERCOND S, 12(11), 1999, pp. 1013-1015
Authors:
Larson, DJ
Foord, DT
Petford-Long, AK
Liew, H
Blamire, MG
Cerezo, A
Smith, GDW
Citation: Dj. Larson et al., Field-ion specimen preparation using focused ion-beam milling, ULTRAMICROS, 79(1-4), 1999, pp. 287-293
Authors:
Rycroft, SFWR
Doyle, RA
Fuchs, DT
Zeldov, E
Fuchs, DT
Zeldov, E
Drost, RJ
Kes, PH
Tamegai, T
Ooi, S
Foord, DT
Citation: Sfwr. Rycroft et al., Bulk transport properties of Bi2Sr2CaCu2O8 crystals in the Corbino disk geometry, PHYS REV B, 60(2), 1999, pp. R757-R760
Authors:
Weyher, JL
Brown, PD
Zauner, ARA
Muller, S
Boothroyd, CB
Foord, DT
Hageman, PR
Humphreys, CJ
Larsen, PK
Grzegory, I
Porowski, S
Citation: Jl. Weyher et al., Morphological and structural characteristics of homoepitaxial GaN grown bymetalorganic chemical vapour deposition (MOCVD), J CRYST GR, 204(4), 1999, pp. 419-428
Authors:
Larson, DJ
Foord, DT
Petford-Long, AK
Anthony, TC
Rozdilsky, IM
Cerezo, A
Smith, GWD
Citation: Dj. Larson et al., Focused ion-beam milling for field-ion specimen preparation: preliminary investigations, ULTRAMICROS, 75(3), 1998, pp. 147-159
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