Authors:
Fornari, R
Bosi, M
Bersani, D
Attolini, G
Lottici, PP
Pelosi, C
Citation: R. Fornari et al., Characterization of HVPE GaN layers by atomic force microscopy and Raman spectroscopy, SEMIC SCI T, 16(9), 2001, pp. 776-782
Authors:
Pelfer, PG
Dubecky, F
Fornari, R
Pikna, M
Gombia, E
Darmo, J
Krempasky, M
Sekacova, M
Citation: Pg. Pelfer et al., Present status and perspectives of the radiation detectors based on InP materials, NUCL INST A, 458(1-2), 2001, pp. 400-405
Citation: R. Fornari et al., Special issue - Proceedings of the Italian Crystal Growth Symposium, Naples, Italy, 7-9 September 1999, MATER CH PH, 66(2-3), 2000, pp. VII-VII
Citation: R. Fornari et J. Jimenez, Semi-insulating InP substrates: Preparation, thermal treatment, physical properties and homogeneity, OPTOEL PROP, 9, 2000, pp. 67-129