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Results: 1-17 |
Results: 17

Authors: Lutzenkirchen-Hecht, D Frahm, R
Citation: D. Lutzenkirchen-hecht et R. Frahm, Corrosion of Mo in KOH: Time resolved XAFS investigations, J PHYS CH B, 105(41), 2001, pp. 9988-9993

Authors: Grunwaldt, JD Lutzenkirchen-Hecht, D Richwin, M Grundmann, S Clausen, BS Frahm, R
Citation: Jd. Grunwaldt et al., Piezo X-ray absorption spectroscopy for the investigation of solid-state transformations in the millisecond range, J PHYS CH B, 105(22), 2001, pp. 5161-5168

Authors: Richwin, M Zaeper, R Lutzenkirchen-Hecht, D Frahm, R
Citation: M. Richwin et al., Piezo-QEXAFS: advances in time-resolved X-ray absorption spectroscopy, J SYNCHROTR, 8, 2001, pp. 354-356

Authors: Lutzenkirchen-Hecht, D Frahm, R
Citation: D. Lutzenkirchen-hecht et R. Frahm, Reflection mode XAFS investigations of reactively sputtered thin films, J SYNCHROTR, 8, 2001, pp. 478-480

Authors: Lutzenkirchen-Hecht, D Scott, N Jacobs, H Frahm, R
Citation: D. Lutzenkirchen-hecht et al., XAFS investigations of tin nitrides, J SYNCHROTR, 8, 2001, pp. 698-700

Authors: Lutzenkirchen-Hecht, D Grundmann, S Frahm, R
Citation: D. Lutzenkirchen-hecht et al., Piezo-QEXAFS with fluorescence detection: fast time-resolved investigations of dilute specimens, J SYNCHROTR, 8, 2001, pp. 6-9

Authors: Zaeper, R Richwin, M Wollmann, R Lutzenkirchen-Hecht, D Frahm, R
Citation: R. Zaeper et al., Realisation of a novel crystal bender for a fast double crystal monochromator, NUCL INST A, 467, 2001, pp. 994-997

Authors: Keil, P Lutzenkirchen-Hecht, D Novikov, DV Hahn, U Frahm, R
Citation: P. Keil et al., Reflectivity studies on a synchrotron radiation mirror in the hard X-ray regime, NUCL INST A, 467, 2001, pp. 275-278

Authors: Gorner, W Hentschel, MP Muller, BR Riesemeier, H Krumrey, M Ulm, G Diete, W Klein, U Frahm, R
Citation: W. Gorner et al., BAMline: the first hard X-ray beamline at BESSY II, NUCL INST A, 467, 2001, pp. 703-706

Authors: Lutzenkirchen-Hecht, D Frahm, R
Citation: D. Lutzenkirchen-hecht et R. Frahm, Structural investigations of sputter deposited thin films: reflection modeEXAFS, specular and non specular X-ray scattering, PHYSICA B, 283(1-3), 2000, pp. 108-113

Authors: Strasser, M Schneegans, M Hammer, H Frahm, R
Citation: M. Strasser et al., Stepped current electromigration test of multilevel aluminum metallizations on wafer level, FRESEN J AN, 365(1-3), 1999, pp. 99-102

Authors: Frahm, R Wollmann, R Hammer, H Lutzenkirchen-Hecht, D
Citation: R. Frahm et al., Design and possibilities of the materials science beamline at DELTA, J SYNCHROTR, 6, 1999, pp. 172-173

Authors: Bornebusch, H Clausen, BS Steffensen, G Lutzenkirchen-Hecht, D Frahm, R
Citation: H. Bornebusch et al., A new approach for QEXAFS data acquisition, J SYNCHROTR, 6, 1999, pp. 209-211

Authors: Lutzenkirchen-Hecht, D Frahm, R
Citation: D. Lutzenkirchen-hecht et R. Frahm, Time-resolved EXAFS investigations of the anodic dissolution of Mo, J SYNCHROTR, 6, 1999, pp. 591-593

Authors: Lutzenkirchen-Hecht, D Buchner, P Uhlenbusch, J Strehblow, HH Frahm, R
Citation: D. Lutzenkirchen-hecht et al., EXAFS investigation of nanoparticles produced in a thermal plasma process, J SYNCHROTR, 6, 1999, pp. 722-724

Authors: Ridley, AJ Crowley, G Link, R Frahm, R Winningham, JD Sharber, JR Russell, J
Citation: Aj. Ridley et al., Variations of the thermospheric nitric oxide mass mixing ratio as a function of Kp, altitude, and magnetic local time, GEOPHYS R L, 26(11), 1999, pp. 1541-1544

Authors: Crowley, G Ridley, A Winningham, D Frahm, R Sharber, J Russell, J
Citation: G. Crowley et al., On the hemispheric symmetry in thermospheric nitric oxide, GEOPHYS R L, 26(11), 1999, pp. 1545-1548
Risultati: 1-17 |