Authors:
Grunwaldt, JD
Lutzenkirchen-Hecht, D
Richwin, M
Grundmann, S
Clausen, BS
Frahm, R
Citation: Jd. Grunwaldt et al., Piezo X-ray absorption spectroscopy for the investigation of solid-state transformations in the millisecond range, J PHYS CH B, 105(22), 2001, pp. 5161-5168
Citation: D. Lutzenkirchen-hecht et R. Frahm, Reflection mode XAFS investigations of reactively sputtered thin films, J SYNCHROTR, 8, 2001, pp. 478-480
Authors:
Lutzenkirchen-Hecht, D
Grundmann, S
Frahm, R
Citation: D. Lutzenkirchen-hecht et al., Piezo-QEXAFS with fluorescence detection: fast time-resolved investigations of dilute specimens, J SYNCHROTR, 8, 2001, pp. 6-9
Citation: D. Lutzenkirchen-hecht et R. Frahm, Structural investigations of sputter deposited thin films: reflection modeEXAFS, specular and non specular X-ray scattering, PHYSICA B, 283(1-3), 2000, pp. 108-113
Authors:
Strasser, M
Schneegans, M
Hammer, H
Frahm, R
Citation: M. Strasser et al., Stepped current electromigration test of multilevel aluminum metallizations on wafer level, FRESEN J AN, 365(1-3), 1999, pp. 99-102
Authors:
Ridley, AJ
Crowley, G
Link, R
Frahm, R
Winningham, JD
Sharber, JR
Russell, J
Citation: Aj. Ridley et al., Variations of the thermospheric nitric oxide mass mixing ratio as a function of Kp, altitude, and magnetic local time, GEOPHYS R L, 26(11), 1999, pp. 1541-1544