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Results:
1-17
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Results: 17
Authors:
Seve, L
Zhu, W
Sinkovic, B
Freeland, JW
Coulthard, I
Antel, WJ
Parkin, SSP
Citation: L. Seve et al., Observation of change in the oxidation state at ferromagnet/insulator interface upon thermal annealing, EUROPH LETT, 55(3), 2001, pp. 439-444
Authors:
Coulthard, I
Sham, TK
Hu, YF
Naftel, SJ
Kim, PS
Freeland, JW
Citation: I. Coulthard et al., Threshold behavior of the Cu L3M4,5M4,5 Auger effect of Cu metal at the L-3 edge - art. no. 115101, PHYS REV B, 6411(11), 2001, pp. 5101
Authors:
Freeland, JW
Coulthard, I
Antel, WJ
Stampfl, APJ
Citation: Jw. Freeland et al., Interface bonding for Fe thin films on GaAs surfaces of differing morphology - art. no. 193301, PHYS REV B, 6319(19), 2001, pp. 3301
Authors:
Antel, WJ
Coulthard, I
Freeland, JW
Stampfl, APJ
Schwickert, MM
Citation: Wj. Antel et al., Method for the measurement of anisotropy and rotational hysteresis using linear dichroism, APPL PHYS L, 79(7), 2001, pp. 997-999
Authors:
Naftel, SJ
Zhang, P
Kim, PS
Sham, TK
Coulthard, I
Antel, WJ
Freeland, JW
Frigo, SP
Fung, MK
Lee, ST
Hu, YF
Yates, BW
Citation: Sj. Naftel et al., Soft x-ray-excited luminescence and optical x-ray absorption fine structures of tris (8-hydroxyquinoline) aluminum, APPL PHYS L, 78(13), 2001, pp. 1847-1849
Authors:
Desimoni, J
Echeverria, G
Punte, G
Mercader, RC
Behar, M
Freeland, JW
Walker, JC
Citation: J. Desimoni et al., Argon ion-irradiation effects at the interface of Cu/Fe bilayers, J PHYS-COND, 12(22), 2000, pp. 4713-4721
Authors:
Coulthard, I
Antel, WJ
Frigo, SP
Freeland, JW
Moore, J
Calaway, WS
Pellin, MJ
Mendelsohn, M
Sham, TK
Naftel, SJ
Stampfl, APJ
Citation: I. Coulthard et al., Resonant Auger studies of metallic systems, J VAC SCI A, 18(4), 2000, pp. 1955-1958
Authors:
Coulthard, I
Antel, WJ
Freeland, JW
Sham, TK
Naftel, SJ
Zhang, P
Citation: I. Coulthard et al., Influence of sample oxidation on the nature of optical luminescence from porous silicon, APPL PHYS L, 77(4), 2000, pp. 498-500
Authors:
Freeland, JW
Bussmann, K
Idzerda, YU
Citation: Jw. Freeland et al., Connecting disorder and magnetic properties in CoFe thin films, APPL PHYS L, 76(18), 2000, pp. 2603-2605
Authors:
Wende, H
Srivastava, P
Arvanitis, D
Wilhelm, F
Lemke, L
Ankudinov, A
Rehr, JJ
Freeland, JW
Idzerda, YU
Baberschke, K
Citation: H. Wende et al., Magnetic L-edge EXAFS of 3d elements: multiple-scattering analysis and spin dynamics, J SYNCHROTR, 6, 1999, pp. 696-698
Authors:
Osgood, RM
Sinha, SK
Freeland, JW
Idzerda, YU
Bader, SD
Citation: Rm. Osgood et al., X-ray scattering from magnetically and structurally rough surfaces, J MAGN MAGN, 199, 1999, pp. 698-702
Authors:
Freeland, JW
Bussmann, K
Idzerda, YU
Kao, CC
Citation: Jw. Freeland et al., Understanding correlations between chemical and magnetic interfacial roughness, PHYS REV B, 60(14), 1999, pp. R9923-R9926
Authors:
Idzerda, YU
Chakarian, V
Freeland, JW
Citation: Yu. Idzerda et al., Quantifying magnetic domain correlations in multilayer films, PHYS REV L, 82(7), 1999, pp. 1562-1565
Authors:
Osgood, RM
Sinha, SK
Freeland, JW
Idzerda, YU
Bader, SD
Citation: Rm. Osgood et al., X-ray scattering from magnetic, rough surfaces, J APPL PHYS, 85(8), 1999, pp. 4619-4621
Authors:
Coulthard, I
Freeland, JW
Winarski, R
Ederer, DL
Jiang, JS
Inomata, A
Bader, SD
Callcott, TA
Citation: I. Coulthard et al., Soft x-ray absorption of a buried SmCo film utilizing substrate fluorescence detection, APPL PHYS L, 74(25), 1999, pp. 3806-3808
Authors:
Freeland, JW
Chakarian, V
Bussmann, K
Idzerda, YU
Wende, H
Kao, CC
Citation: Jw. Freeland et al., Exploring magnetic roughness in CoFe thin films, J APPL PHYS, 83(11), 1998, pp. 6290-6292
Authors:
Wende, H
Freeland, JW
Chakarian, V
Idzerda, YU
Lemke, L
Baberschke, K
Citation: H. Wende et al., Probing local magnetic disorder by investigating spin dependent photoelectron scattering, J APPL PHYS, 83(11), 1998, pp. 7028-7030
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