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Results: 1-10 |
Results: 10

Authors: Fundora, A Martinez, E Amorin, H Contreras, OE Siqueiros, JM
Citation: A. Fundora et al., Pb(Mg1/3Nb2/3)(0.97)Ti0.03O3 ferroelectric thin films, deposited by laser ablation on TiN bottom electrodes, J ELECTROCE, 6(1), 2001, pp. 21-25

Authors: Guerrero, F Amorin, H Portelles, J Fundora, A Perez, J Siqueiros, J Aguilera, S
Citation: F. Guerrero et al., Effects of the sinterization process and the influence of the lanthanum content in the Sr0.3-3Y/2LaYBa0.7Nb2O5 ceramic system, BOL SOC CH, 45(1), 2000, pp. 59-69

Authors: Fundora, A Siqueiros, JM
Citation: A. Fundora et Jm. Siqueiros, Deposition and characterization of PMNT thin films, THIN SOL FI, 373(1-2), 2000, pp. 60-63

Authors: Fundora, A Portelles, JJ Rosario, G Siqueiros, JM
Citation: A. Fundora et al., Study of the relaxor ferroelectric properties of the Pb(Mg1/3Nb2/3)(3(1-x))TixO3 ceramic, REV MEX FIS, 46(4), 2000, pp. 357-360

Authors: Siqueiros, JM Fundora, A Cruz, MD Amorin, H Portelles, J
Citation: Jm. Siqueiros et al., A study of the fundamental problems in ferroelectric films, REV MEX FIS, 46, 2000, pp. 113-119

Authors: Amorin, H Portelles, J Guerrero, F Fundora, A Martinez, E Siqueiros, JM
Citation: H. Amorin et al., Formation of the La0.03Sr0.255Ba0.7Nb2-yTiyO6-y/2 ferroelectric ceramic system, J MATER SCI, 35(18), 2000, pp. 4607-4613

Authors: Amorin, H Portelles, J Guerrero, F Fundora, A Siqueiros-Beltrones, JM
Citation: H. Amorin et al., Diffuse phase transition in the (La0.03Sr0.255Ba0.7)(Nb2-yTiy)O-6.y/2 ferroelectric ceramic system, FERROELECTR, 248(1-4), 2000, pp. 97-106

Authors: Portelles, J Amorin, H Guerrero, F Fundora, A Siqueiros, JM Valenzuela, J Hirata, G Rosario, G
Citation: J. Portelles et al., Variation of pyroelectric and dielectric properties in Sr0.3-3y/2LayBa0.7Nb2O6 ceramics by impurification with various concentrations of La, REV MEX FIS, 45, 1999, pp. 78-80

Authors: Cruz, MD Siqueiros, JM Valenzuela, J Machorro, R Portelles, JJ Fundora, A
Citation: Md. Cruz et al., Characterization of Pt thin films deposited by DC sputtering at different temperatures on Ti/glass and TiO2/Si substrates, FERROELECTR, 225(1-4), 1999, pp. 1125-1131

Authors: Portelles, J Siqueiros, JM Fundora, A Rosario, G Machorro, R Hirata, G Calderon, F
Citation: J. Portelles et al., Piezoelectricity and aging effects in the PMN-PT system, FERROELECTR, 224(1-4), 1999, pp. 631-638
Risultati: 1-10 |