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Results:
1-8
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Results: 8
Authors:
Kovacs, A
Baranyai, M
Wojnarovits, L
McLaughlin, WL
Miller, SD
Miller, A
Fuochi, PG
Lavalle, M
Slezsak, I
Citation: A. Kovacs et al., Application of the Sunna dosimeter film in gamma and electron beam radiation processing, RADIAT PH C, 57(3-6), 2000, pp. 691-695
Authors:
Emmi, SS
Ceroni, P
Lavalle, M
Fuochi, PG
D'Angelantonio, M
Alberti, A
Macciantelli, D
Kovacs, A
Takacs, E
Citation: Ss. Emmi et al., Radiochromic properties of alpha-terthiophene-cellulose triacetate films, RADIAT PH C, 57(3-6), 2000, pp. 707-710
Authors:
Da Rold, M
Bacchetta, N
Bisello, D
Cavone, M
Dalla Betta, GF
De Liso, G
Dell'Orso, R
Fuochi, PG
Lanza, A
Messineo, A
Mihul, A
Militaru, O
Paccagnella, A
Tonelli, G
Verdini, PG
Verzellesi, G
Wheadon, R
Citation: M. Da Rold et al., Multiguard structures for high-voltage operation of radiation-damaged silicon detectors, NUOV CIM A, 112(1-2), 1999, pp. 13-22
Authors:
Lavalle, M
Camaioni, N
Casalbore-Miceli, G
Fuochi, PG
Geri, A
Citation: M. Lavalle et al., Effect of the ionizing radiation on poly(4,4 '-dipentoxy-2,2 '-bithiophene) films electrosynthesized on indium-tin oxide plates, RADIAT PH C, 56(3), 1999, pp. 303-308
Authors:
Mehta, K
Fuochi, PG
Kovacs, A
Lavalle, M
Hargittai, P
Citation: K. Mehta et al., Dose distribution in electron-irradiated PMMA: effect of dose and geometry, RADIAT PH C, 55(5-6), 1999, pp. 773-779
Authors:
Candelori, A
Paccagnella, A
Scarpa, A
Ghidini, G
Fuochi, PG
Citation: A. Candelori et al., Degradation of electron irradiated MOS capacitors, MICROEL REL, 39(2), 1999, pp. 227-233
Authors:
Da Rold, M
Bacchetta, N
Bisello, D
Paccagnella, A
Dalla Betta, GF
Verzellesi, G
Militaru, O
Wheadon, R
Fuochi, PG
Bozzi, C
Dell'Orso, R
Messineo, A
Tonelli, G
Verdini, PG
Citation: M. Da Rold et al., Study of breakdown effects in silicon multiguard structures, IEEE NUCL S, 46(4), 1999, pp. 1215-1223
Authors:
Candelori, A
Paccagnella, A
Cammarata, M
Ghidini, G
Fuochi, PG
Citation: A. Candelori et al., Fowler-Nordheim characteristics of electron irradiated MOS capacitors, IEEE NUCL S, 45(6), 1998, pp. 2383-2390
Risultati:
1-8
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