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Authors: NEL JM DEMANET CM HILLIE KT AURET FD GAIGHER HL
Citation: Jm. Nel et al., USING SCANNING FORCE MICROSCOPY (SFM) TO INVESTIGATE VARIOUS CLEANINGPROCEDURES OF DIFFERENT TRANSPARENT CONDUCTING OXIDE SUBSTRATES, Applied surface science, 134(1-4), 1998, pp. 22-30

Authors: GAIGHER HL ALBERTS HW
Citation: Hl. Gaigher et Hw. Alberts, TEM STUDY OF ION-IMPLANTED GAAS AFTER PULSED ELECTRON-BEAM ANNEALING, Radiation effects and defects in solids, 125(4), 1993, pp. 373-380

Authors: ALBERTS HW GAIGHER HL BREDELL LJ
Citation: Hw. Alberts et al., CHANNELING AND TEM INVESTIGATIONS OF PULSE ELECTRON-BEAM ANNEALED GAAS IMPLANTED WITH PB, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 519-522
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