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Results:
1-9
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Results: 9
Authors:
LUBLINSKAYA O
GUREVICH S
EKIMOV A
KUDRYAVTSEV I
OSINSKII A
GANDAIS M
WANG Y
Citation: O. Lublinskaya et al., CDS NANOCRYSTAL GROWTH IN THIN SILICA FILMS - EVOLUTION OF SIZE DISTRIBUTION FUNCTION, Journal of crystal growth, 185, 1998, pp. 360-364
Authors:
RODICHEV D
LAVALLARD P
DOORYHEE E
SLAOUI A
PERRIERE J
GANDAIS M
WANG Y
Citation: D. Rodichev et al., FORMATION OF SI NANOCRYSTALS BY HEAVY-ION IRRADIATION OF AMORPHOUS SIO FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 107(1-4), 1996, pp. 259-262
Authors:
RICOLLEAU C
GANDAIS M
GACOIN T
BOILOT JP
Citation: C. Ricolleau et al., CORRELATION BETWEEN STRUCTURAL AND OPTICAL-PROPERTIES OF PBS NANOCRYSTALS, Journal of crystal growth, 166(1-4), 1996, pp. 769-773
Authors:
RICOLLEAU C
AUDINET L
GANDAIS M
GACOIN T
BOILOT JP
CHAMARRO M
Citation: C. Ricolleau et al., INFLUENCE OF GROWTH-CONDITIONS ON THE STRUCTURAL-PROPERTIES OF CDSXSE1-X (X=0.4 AND X=1) NANOCRYSTALS, Journal of crystal growth, 159(1-4), 1996, pp. 861-866
Authors:
HYTCH MJ
GANDAIS M
Citation: Mj. Hytch et M. Gandais, QUANTITATIVE CRITERIA FOR THE DETECTION AND CHARACTERIZATION OF NANOCRYSTALS FROM HIGH-RESOLUTION ELECTRON-MICROSCOPY IMAGES, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 72(3), 1995, pp. 619-634
Authors:
EKIMOV A
GUREVICH S
KUDRIAVTSEV I
LUBLINSKAYA O
MERKULOV A
OSINSKII A
VATNIK M
GANDAIS M
WANG Y
Citation: A. Ekimov et al., GROWTH OF CDSE NANOCRYSTALS IN ION-IMPLANTED SIO2-FILMS, Journal of crystal growth, 151(1-2), 1995, pp. 38-45
Authors:
RODITCHEV D
LAVALLARD P
GANDAIS M
DOORYHEE E
SLAOUI A
PERRIERE J
Citation: D. Roditchev et al., PHOTOLUMINESCENCE OF SI NANOCRYSTALS CREATED BY HEAVY-ION IRRADIATIONOF AMORPHOUS SIO FILMS, JPN J A P 2, 34, 1994, pp. 34-36
Authors:
GANDAIS M
ALLAIS M
ZHENG Y
CHAMARRO M
Citation: M. Gandais et al., CDSXSE1-X NANOCRYSTALS GROWN FROM SOLID-SOLUTION IN SILICATE GLASS - STRUCTURAL AND INTERFACIAL ASPECTS - HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY AND OPTICAL-ABSORPTION SPECTROSCOPY, Journal de physique. IV, 4(C3), 1994, pp. 47-56
Authors:
ZHENG Y
TACCOEN A
GANDAIS M
PETROFF JF
Citation: Y. Zheng et al., EVIDENCE OF A LAMELLAR MICROSTRUCTURE IN BETA-FESI2 THIN-FILMS GROWN ON SI(111) BY SOLID-PHASE EPITAXY - A TRANSMISSION ELECTRON-MICROSCOPYANALYSIS, Journal of applied crystallography, 26, 1993, pp. 388-395
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1-9
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