Authors: MUSSEAU O GARDIC F ROCHE P CORBIERE T REED RA BUCHNER S MCDONALD P MELINGER J TRAN L CAMPBELL AB

Citation: O. Musseau et al., ANALYSIS OF MULTIPLE BIT UPSETS (MBU) IN A CMOS SRAM, IEEE transactions on nuclear science, 43(6), 1996, pp. 2879-2888

Authors: GARDIC F MUSSEAU O FLAMENT O BRISSET C FERLETCAVROIS V MARTINEZ M CORBIERE T

Citation: F. Gardic et al., ANALYSIS OF LOCAL AND GLOBAL TRANSIENT EFFECTS IN A CMOS SRAM, IEEE transactions on nuclear science, 43(3), 1996, pp. 899-906

Authors: GARDIC F FLAMENT O MUSSEAU O BRISSET C MARTINEZ M BRUNET JP BLANQUART L

Citation: F. Gardic et al., DYNAMIC SINGLE EVENT EFFECTS IN A CMOS THICK SOI SHIFT REGISTER/, IEEE transactions on nuclear science, 43(3), 1996, pp. 960-966