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Results: 10

Authors: REUTER D GERTH G KIRSCHNER J
Citation: D. Reuter et al., ANISOTROPIC DIFFUSION OF 3D METALS ON W(110) - COMPETITION BETWEEN CRYSTALLINE-STRUCTURE AND SURFACE STEPS, Physical review. B, Condensed matter, 57(4), 1998, pp. 2520-2529

Authors: REUTER D GERTH G KIRSCHNER J
Citation: D. Reuter et al., MODIFYING DIFFUSION ANISOTROPIES - CAP LAYER INDUCED CHANGES IN SPREADING ANISOTROPIES, Journal of applied physics, 82(11), 1997, pp. 5374-5377

Authors: HOFMEISTER H GROSSE S GERTH G HAEFKE H
Citation: H. Hofmeister et al., 2-DIMENSIONAL REGULAR ARRAYS OF NANOSCALE METAL PARTICLES BY ORDERED NUCLEATION ON RECONSTRUCTED SURFACES, Nanostructured materials, 6(1-4), 1995, pp. 529-532

Authors: HOWALD L LUTHI R MEYER E GERTH G HAEFKE HG OVERNEY R GUNTHERODT HJ
Citation: L. Howald et al., FRICTION FORCE MICROSCOPY ON CLEAN SURFACES OF NACL, NAF, AND AGBR, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2227-2230

Authors: LUTHI R HAEFKE H MEYER E HOWALD L LANG HP GERTH G GUNTHERODT HJ
Citation: R. Luthi et al., FRICTIONAL AND ATOMIC-SCALE STUDY OF C-60 THIN-FILMS BY SCANNING FORCE MICROSCOPY, Zeitschrift fur Physik. B, Condensed matter, 95(1), 1994, pp. 1-3

Authors: HOWALD L HAEFKE H LUTHI R MEYER E GERTH G RUDIN H GUNTHERODT HJ
Citation: L. Howald et al., ULTRAHIGH-VACUUM SCANNING FORCE MICROSCOPY - ATOMIC-SCALE RESOLUTION AT MONATOMIC CLEAVAGE STEPS, Physical review. B, Condensed matter, 49(8), 1994, pp. 5651-5656

Authors: HOFMEISTER H GROSSE S GERTH G HAEFKE H
Citation: H. Hofmeister et al., FRACTAL MODEL OF SUPERSTRUCTURES ON AGBR(111), Physical review. B, Condensed matter, 49(11), 1994, pp. 7646-7653

Authors: HAEFKE H SCHWARZ UD GUNTHERODT HJ FROB H GERTH G STEIGER R
Citation: H. Haefke et al., INVESTIGATION OF AGBR PHOTOGRAPHIC SYSTEMS WITH SCANNING FORCE MICROSCOPY, Journal of imaging science and technology, 37(6), 1993, pp. 545-551

Authors: DAMMER U ANSELMETTI D DREIER M FROMMER J FUNFSCHILLING J GERTH G GUNTHERODT HJ HAEFKE H HIDBER HR HOWALD L HUG HJ JUNG TH LANG HP LUTHI R MEYER E MOSER A PARASHIKOV I REIMANN P RICHMOND T RUETSCHI M RUDIN H SCHWARZ UD STAUFER U SUM R
Citation: U. Dammer et al., SCANNING PROBE MICROSCOPY FOR INDUSTRIAL APPLICATIONS - SELECTED EXAMPLES, Scanning, 15(5), 1993, pp. 257-264

Authors: GERTH G GROSSE S KROHN M HAEFKE H
Citation: G. Gerth et al., FRACTAL ANALYSIS OF DEVELOPMENT OF TWIN DOMAINS IN THIN-FILMS, Helvetica Physica Acta, 66(4), 1993, pp. 435-436
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