Authors: GLAISHER RW COCKAYNE DJH

Citation: Rw. Glaisher et Djh. Cockayne, CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESSFRINGE IMAGING, Micron, 24(3), 1993, pp. 257-264

Authors: GLAISHER RW COCKAYNE DJH USHER BF

Citation: Rw. Glaisher et al., IN0.2GA0.8AS GAAS INTERFACE REVEALED BY AN ALAS MARKER LAYER/, Applied physics. A, Solids and surfaces, 57(5), 1993, pp. 401-405