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Results: 26-37/37
Authors:
GNASER H
Citation: H. Gnaser, IMPROVED QUANTIFICATION IN SECONDARY-ION MASS-SPECTROMETRY DETECTING MCS-IONS( MOLECULAR), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(2), 1994, pp. 452-456
Authors:
GNASER H
OECHSNER H
Citation: H. Gnaser et H. Oechsner, EMISSION OF MCS+ SECONDARY IONS FROM SEMICONDUCTORS BY CESIUM BOMBARDMENT, Surface and interface analysis, 21(4), 1994, pp. 257-260
Authors:
LORINCIK J
SROUBEK Z
GNASER H
Citation: J. Lorincik et al., DOUBLY-CHARGED ION EMISSION IN SPUTTERING OF LANTHANUM TRIFLUORIDE, Surface science, 314(3), 1994, pp. 373-377
Authors:
GNASER H
OECHSNER H
Citation: H. Gnaser et H. Oechsner, THE INFLUENCE OF POLARIZABILITY ON THE EMISSION OF SPUTTERED MOLECULAR-IONS, Surface science, 302(1-2), 1994, pp. 120000289-120000292
Authors:
BOCK W
GNASER H
OECHSNER H
Citation: W. Bock et al., SECONDARY-NEUTRAL AND SECONDARY-ION MASS-SPECTROMETRY ANALYSIS OF TIN-BASED HARD COATINGS - AN ASSESSMENT OF QUANTIFICATION PROCEDURES, Analytica chimica acta, 297(1-2), 1994, pp. 277-283
Authors:
GNASER H
BOCK W
OECHSNER H
BHATTACHARAYYA TK
Citation: H. Gnaser et al., COMPARATIVE SIMS AND SNMS ANALYSES OF AMORPHOUS-SEMICONDUCTOR THIN-FILMS, Applied surface science, 70-1, 1993, pp. 44-48
Authors:
GNASER H
OECHSNER H
Citation: H. Gnaser et H. Oechsner, A SEARCH FOR DOUBLY-CHARGED NEGATIVE CLUSTER IONS IN SPUTTERING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 82(4), 1993, pp. 518-521
Authors:
GNASER H
OECHSNER H
Citation: H. Gnaser et H. Oechsner, LOW-ENERGY SPUTTERING OF SMALL NEUTRAL CLUSTERS FROM ALLOYS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 82(2), 1993, pp. 347-351
Authors:
WEATHERS DL
HUTCHEON ID
GNASER H
TOMBRELLO TA
SHAPIRO MH
Citation: Dl. Weathers et al., NOTE ON ISOTOPE SPUTTERING - REPLY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 82(1), 1993, pp. 194-195
Authors:
GNASER H
STELTMANN J
OECHSNER H
Citation: H. Gnaser et al., FLUENCE DEPENDENT CONCENTRATION OF LOW-ENERGY GA IMPLANTED IN SI, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 110-114
Authors:
GNASER H
OECHSNER H
Citation: H. Gnaser et H. Oechsner, YIELDS AND COMPOSITION CHANGES IN LOW-ENERGY SPUTTERING OF BINARY-ALLOYS - EXPERIMENTS AND COMPUTER-SIMULATIONS, Physical review. B, Condensed matter, 47(21), 1993, pp. 14093-14102
Authors:
BIECK W
GNASER H
OECHSNER H
Citation: W. Bieck et al., SECONDARY-NEUTRAL MICROPROBE WITH ELECTRON-GAS POST-IONIZATION, Applied physics letters, 63(6), 1993, pp. 845-847