Citation: M. Wolovelsky et al., SCANNING TUNNELING SPECTROSCOPY OF A 2-DIMENSIONAL ELECTRON-GAS ON THE SURFACE OF ZNO, Physical review. B, Condensed matter, 57(11), 1998, pp. 6274-6277
Authors:
WEISZ SZ
PORRAS AR
GOMEZ M
MANY A
GOLDSTEIN Y
SAVIR E
Citation: Sz. Weisz et al., RELATION BETWEEN LUMINESCENCE AND ELECTRONIC SURFACE CHARACTERISTICS IN P-TYPE POROUS SILICON, Journal of luminescence, 72-4, 1997, pp. 729-730
Citation: Y. Goldstein, ELUSIVE PROPHET - HAAM,AHAD AND THE ORIGINS OF ZIONISM - ZIPPERSTEIN,SJ, The Journal of modern history, 68(2), 1996, pp. 442-444
Authors:
BARSADEH E
GOLDSTEIN Y
WOLOVELSKY M
PORATH D
ZHANG C
DENG H
ABELES B
MILLO O
Citation: E. Barsadeh et al., LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY STUDIES OF GRANULAR METAL-FILMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1084-1088
Authors:
PORATH D
BARSADEH E
WOLOVELSKY M
GRAYEVSKY A
GOLDSTEIN Y
MILLO O
Citation: D. Porath et al., ANNEALING STUDY OF GOLD-FILMS USING SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1165-1170
Authors:
SAVIR E
MANY A
GOLDSTEIN Y
WEISZ SZ
AVALOS J
Citation: E. Savir et al., SPACE-CHARGE LAYERS AND SURFACE-STATES AT THE SILICON ELECTROLYTE INTERFACE/, Surface review and letters, 2(6), 1995, pp. 765-772
Authors:
GOLDSTEIN Y
MANY A
WEISZ SZ
GOMEZ M
RESTO O
FARIAS MH
Citation: Y. Goldstein et al., YIELDS, SENSITIVITIES AND NATURAL LINE-SHAPES OF HIGH-ENERGY AUGER LINES - TA, W, PT, AU, PB AND BI, Journal of electron spectroscopy and related phenomena, 67(3), 1994, pp. 511-518
Authors:
BARSADEH E
GOLDSTEIN Y
ZHANG C
DENG H
ABELES B
MILLO O
Citation: E. Barsadeh et al., SINGLE-ELECTRON TUNNELING EFFECTS IN GRANULAR METAL-FILMS, Physical review. B, Condensed matter, 50(12), 1994, pp. 8961-8964
Authors:
MANY A
GOLDSTEIN Y
WEISZ SZ
PENALBERT J
MUNOZ W
GOMEZ M
Citation: A. Many et al., STUDY OF THE DENSITY-OF-STATES IN A-SI-H USING THE SI ELECTROLYTE SYSTEM/, Journal of non-crystalline solids, 166, 1993, pp. 411-414