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Authors: GRIEP S KEITELSCHULZ D SCHMITTLANDSIEDEL D
Citation: S. Griep et al., DESIGN BASED FAILURE ANALYSIS AND YIELD IMPROVEMENT IN CMOS-CIRCUITS, Quality and reliability engineering international, 12(4), 1996, pp. 221-227

Authors: KHARE JB MARY W GRIEP S SCHMITTLANDSIEDEL D
Citation: Jb. Khare et al., YIELD-ORIENTED COMPUTER-AIDED DEFECT DIAGNOSIS, IEEE transactions on semiconductor manufacturing, 8(2), 1995, pp. 195-206

Authors: SCHMITTLANDSIEDEL D KEITELSCHULZ D KHARE J GRIEP S MALY W
Citation: D. Schmittlandsiedel et al., CRITICAL AREA ANALYSIS FOR DESIGN-BASED YIELD IMPROVEMENT OF VLSI CIRCUITS, Quality and reliability engineering international, 11(4), 1995, pp. 227-232
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