Authors: TALLANT DR KELLY MJ GUILINGER TR SIMPSON RL

Citation: Dr. Tallant et al., POROUS SILICON PHOTOLUMINESCENCE - IMPLICATIONS FROM IN-SITU STUDIES, Journal of applied physics, 80(12), 1996, pp. 7009-7017

Authors: GUILINGER TR KELLY MJ CHASON EH HEADLEY TJ HOWARD AJ

Citation: Tr. Guilinger et al., NONDESTRUCTIVE MEASUREMENT OF POROUS SILICON THICKNESS USING X-RAY REFLECTIVITY, Journal of the Electrochemical Society, 142(5), 1995, pp. 1634-1636

Authors: REDMAN DA FOLLSTAEDT DM GUILINGER TR KELLY MJ

Citation: Da. Redman et al., PHOTOLUMINESCENCE AND PASSIVATION OF SILICON NANOSTRUCTURES, Applied physics letters, 65(19), 1994, pp. 2386-2388

Authors: GUILINGER TR VOYTKO JE WHITE RE YIN KM

Citation: Tr. Guilinger et al., CHARACTERIZATION OF AMORPHOUS NI-CR-P ELECTRODEPOSITS, Plating and surface finishing, 80(3), 1993, pp. 46-50