Authors: ABRAHAM M EHRFELD W LACHER M MAYR K NOELL W GUTHNER P BARENZ J

Citation: M. Abraham et al., MICROMACHINED APERTURE PROBE TIP FOR MULTIFUNCTIONAL SCANNING PROBE MICROSCOPY, Ultramicroscopy, 71(1-4), 1998, pp. 93-98

Authors: RUF A ABRAHAM M DIEBEL J EHRFELD W GUTHNER P LACHER M MAYR K REINHARDT J

Citation: A. Ruf et al., INTEGRATED FABRY-PEROT DISTANCE CONTROL FOR ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(3), 1997, pp. 579-585

Authors: NOELL W ABRAHAM M MAYR K RUF A BARENZ J HOLLRICHER O MARTI O GUTHNER P

Citation: W. Noell et al., MICROMACHINED APERTURE PROBE TIP FOR MULTIFUNCTIONAL SCANNING PROBE MICROSCOPY, Applied physics letters, 70(10), 1997, pp. 1236-1238

Authors: GUTHNER P

Citation: P. Guthner, SIMULTANEOUS IMAGING OF SI(111) 7X7 WITH ATOMIC-RESOLUTION IN SCANNING-TUNNELING-MICROSCOPY, ATOMIC-FORCE MICROSCOPY, AND ATOMIC-FORCE MICROSCOPY NONCONTACT MODE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 2428-2431

Authors: HOWALD L LUTHI R MEYER E GUTHNER P GUNTHERODT HJ

Citation: L. Howald et al., SCANNING FORCE MICROSCOPY ON THE SI(111)7 X 7 SURFACE RECONSTRUCTION, Zeitschrift fur Physik. B, Condensed matter, 93(3), 1994, pp. 267-268

Authors: BINGGELI M KOTROTSIOS G CHRISTOPH R HINTERMANN HE BERGHAUS T GUTHNER P

Citation: M. Binggeli et al., NOVEL DESIGN FOR A COMPACT FIBEROPTIC SCANNING FORCE MICROSCOPE, Review of scientific instruments, 64(10), 1993, pp. 2888-2891