Authors: Simoen, E Poyai, A Claeys, C Lukyanchikova, N Petrichuk, M Garbar, N Czerwinski, A Katcki, J Ratajczak, J Gaubas, E

Citation: E. Simoen et al., Electrical characterization of shallow cobalt-silicided junctions, J MAT S-M E, 12(4-6), 2001, pp. 207-210

Authors: Lukyanchikova, NB Petrichuk, MV Garbar, N Simoen, E Poyai, A Claeys, C

Citation: Nb. Lukyanchikova et al., Impact of cobalt silicidation on the low-frequency noise behavior of shallow P-N junctions, IEEE ELEC D, 21(8), 2000, pp. 408-410

Authors: Lukyanchikova, N Garbar, N Petrichuk, M Simoen, E Claeys, C

Citation: N. Lukyanchikova et al., Flicker noise in deep submicron nMOS transistors, SOL ST ELEC, 44(7), 2000, pp. 1239-1245