Authors:
Kregsamer, P
Streli, C
Wobrauschek, P
Gatterbauer, H
Pianetta, P
Palmetshofer, L
Brehm, LL
Citation: P. Kregsamer et al., Synchrotron radiation-excited glancing incidence XRF for depth profile andthin-film analysis of light elements, X-RAY SPECT, 28(4), 1999, pp. 292-296