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Results:
1-16
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Results: 16
Authors:
Misiuk, A
Barcz, A
Ratajczak, J
Katcki, J
Bak-Misiuk, J
Bryja, L
Surma, B
Gawlik, G
Citation: A. Misiuk et al., Structure of oxygen - Implanted silicon single crystals treated at >= 1400K under high argon pressure, CRYST RES T, 36(8-10), 2001, pp. 933-941
Authors:
Surma, B
Bryja, L
Misiuk, A
Gawlik, G
Jun, J
Antonova, IV
Prujszczyk, M
Citation: B. Surma et al., Infrared and photoluminescence studies on silicon oxide formation in oxygen-implanted silicon annealed under enhanced pressure, CRYST RES T, 36(8-10), 2001, pp. 943-952
Authors:
Jagielski, J
Piatkowska, A
Matz, W
Richter, E
Gawlik, G
Turos, A
Citation: J. Jagielski et al., Structural and micromechanical properties of ion-beam mixed tungsten-on-steel system, VACUUM, 63(4), 2001, pp. 671-677
Authors:
Gawlik, G
Ratajczak, R
Turos, A
Jagielski, J
Bedell, S
Lanford, WL
Citation: G. Gawlik et al., Hydrogen-ion implantation in GaAs, VACUUM, 63(4), 2001, pp. 697-700
Authors:
Jaroszewicz, B
Slysz, W
Wegrzecki, M
Domanski, K
Grodecki, R
Gawlik, G
Kudla, A
Wrzesinska, H
Gorska, M
Grabiec, P
Citation: B. Jaroszewicz et al., Investigation of ion implantation for fabrication of p-n junctions with modified silicon surface for photovoltaic devices, VACUUM, 63(4), 2001, pp. 721-724
Authors:
Wierzchowski, W
Wieteska, K
Turos, A
Graeff, W
Gawlik, G
Citation: W. Wierzchowski et al., Synchrotron investigation of strain profiles in the implanted semiconductors, VACUUM, 63(4), 2001, pp. 767-773
Authors:
Turos, A
Gawlik, G
Jagielski, J
Stonert, A
Madi, N
Matz, W
Mucklich, A
Citation: A. Turos et al., Atomic transport effects in Kr-ion bombarded ZrO2/Fe ternary system, NUCL INST B, 166, 2000, pp. 128-132
Authors:
Jagielski, J
Piatkowska, A
Rymuza, Z
Kusznierewicz, Z
Treheux, D
Boutard, D
Thome, L
Gawlik, G
Citation: J. Jagielski et al., Micromechanical measurements of ion-beam treated steel, WEAR, 238(1), 2000, pp. 48-55
Authors:
Baszkiewicz, J
Kamiinski, M
Kozubowski, J
Krupa, D
Gosiewska, K
Barcz, A
Gawlik, G
Jagielski, J
Citation: J. Baszkiewicz et al., Implantation of silicon ions into a surface layer of the Ti6A14V titanium alloy and its effect upon the corrosion resistance and structure of this layer, J MATER SCI, 35(3), 2000, pp. 767-775
White beam synchrotron topographic characterisation of silicon wafers directly bonded by oxide layer
Authors:
Wierzchowski, W
Wieteska, K
Graeff, W
Gawlik, G
Pawlowska, M
Citation: W. Wierzchowski et al., White beam synchrotron topographic characterisation of silicon wafers directly bonded by oxide layer, ACT PHY P A, 96(2), 1999, pp. 283-288
Effect of carbon ion implantation on the structure and corrosion resistance of OT-4-0 titanium alloy
Authors:
Krupa, D
Jezierska, E
Baszkiewicz, J
Wierzchon, T
Barcz, A
Gawlik, G
Jagielski, J
Sobczak, JW
Bilinski, A
Larisch, B
Citation: D. Krupa et al., Effect of carbon ion implantation on the structure and corrosion resistance of OT-4-0 titanium alloy, SURF COAT, 114(2-3), 1999, pp. 250-259
Authors:
Piatkowska, A
Gawlik, G
Jagielski, J
Citation: A. Piatkowska et al., AFM studies of hydrogen implanted silicon, APPL SURF S, 141(3-4), 1999, pp. 333-338
Authors:
Uglov, VV
Fedotova, JA
Jagielski, J
Gawlik, G
Stanek, J
Citation: Vv. Uglov et al., Transformation of amorphous a-(Fe-B) phase during nitrogen implantation, NUCL INST B, 159(4), 1999, pp. 218-226
Authors:
Turos, A
Gawlik, G
Jagielski, J
Stonert, A
Matz, W
Groetzschel, R
Citation: A. Turos et al., Ion beam mixing of the ZrO2/Fe system, NUCL INST B, 148(1-4), 1999, pp. 778-782
Authors:
Jagielski, J
Gawlik, G
Turos, A
Piatkowska, A
Treheux, D
Starczewski, L
Szudrowicz, M
Citation: J. Jagielski et al., Study of micromechanical properties of ion-beam mixed layers, NUCL INST B, 148(1-4), 1999, pp. 941-945
Authors:
Baszkiewicz, J
Kozubowski, JA
Krupa, D
Kaminski, M
Barcz, A
Gawlik, G
Jagielski, J
Citation: J. Baszkiewicz et al., Effect of silicon-ion implantation upon the corrosion properties of austenitic stainless steels, J MATER SCI, 33(18), 1998, pp. 4561-4568
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