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Results: 1-19 |
Results: 19

Authors: Georgakilas, A Czigany, Z Amimer, K Davydov, VY Toth, L Pecz, B
Citation: A. Georgakilas et al., MBE growth of different hexagonal GaN crystal structures on vicinal (100) GaAs substrates, MAT SCI E B, 82(1-3), 2001, pp. 16-18

Authors: Aperathitis, E Cengher, D Kayambaki, M Androulidaki, M Deligeorgis, G Tsagaraki, K Hatzopoulous, Z Georgakilas, A
Citation: E. Aperathitis et al., Evaluation of reactive ion etching processes for fabrication of integratedGaAs/AlGaAs optoelectronic devices, MAT SCI E B, 80(1-3), 2001, pp. 77-80

Authors: Cengher, D Aperathitis, E Androulidaki, M Deligeorgis, G Kayambaki, M Hatzopoulos, Z Tzanetakis, P Georgakilas, A
Citation: D. Cengher et al., Evaluation of performance capabilities of emitters and detectors based on a common MQW structure, MAT SCI E B, 80(1-3), 2001, pp. 241-244

Authors: Amimer, K Georgakilas, A Androulidaki, M Tsagaraki, K Pavelescu, M Mikroulis, S Constantinidis, G Arbiol, J Peiro, F Cornet, A Calamiotou, M Kuzmik, J Davydov, VY
Citation: K. Amimer et al., Study of the correlation between GaN material properties and the growth conditions of radio frequency plasma-assisted molecular beam epitaxy, MAT SCI E B, 80(1-3), 2001, pp. 304-308

Authors: Kyriakis-Bitzaros, ED Haralabidis, N Lagadas, M Georgakilas, A Moisiadis, Y Halkias, G
Citation: Ed. Kyriakis-bitzaros et al., Realistic end-to-end simulation of the optoelectronic links and comparisonwith the electrical interconnections for system-on-chip applications, J LIGHTW T, 19(10), 2001, pp. 1532-1542

Authors: Bak-Misiuk, J Dynowska, E Misiuk, A Calamiotou, M Kozanecki, A Domagala, J Kuristyn, D Glukhanyuk, W Georgakilas, A Trela, J Adamczewska, J
Citation: J. Bak-misiuk et al., Effect of high temperature-pressure on GaAs layers grown on vicinal Si substrates, CRYST RES T, 36(8-10), 2001, pp. 997-1003

Authors: Kyriakis-Bitzaros, ED Haralabidis, N Moisiadis, Y Lagadas, M Georgakilas, A Halkias, G
Citation: Ed. Kyriakis-bitzaros et al., Comparison of the signal latency in optical and electrical interconnections for interchip links, OPT ENG, 40(1), 2001, pp. 144-146

Authors: Calamiotou, M Chrysanthakopoulos, N Lioutas, C Tsagaraki, K Georgakilas, A
Citation: M. Calamiotou et al., Microstructural differences of the two possible orientations of GaAs on vicinal (001) Si substrates, J CRYST GR, 227, 2001, pp. 98-103

Authors: Hatzopoulos, Z Cengher, D Deligeorgis, G Androulidaki, M Aperathitis, E Halkias, G Georgakilas, A
Citation: Z. Hatzopoulos et al., Molecular beam epitaxy of GaAs/AlGaAs epitaxial structures for integrated optoelectronic devices on Si using GaAs-Si wafer bonding, J CRYST GR, 227, 2001, pp. 193-196

Authors: Georgakilas, A Amimer, K Tzanetakis, P Hatzopoulos, Z Cengher, M Pecz, B Czigany, Z Toth, L Baidakova, MV Sakharov, AV Davydov, VY
Citation: A. Georgakilas et al., Correlation of the structural and optical properties of GaN grown on vicinal (001) GaAs substrates with the plasma-assisted MBE growth conditions, J CRYST GR, 227, 2001, pp. 410-414

Authors: Georgakilas, A Tsagaraki, K Makarona, E Constantinidis, G Adroulidaki, M Kayambaki, M Aperathitis, E Pelekanos, NT
Citation: A. Georgakilas et al., Direct MBE growth of GaN on GaAs substrates for integrated short wavelength emitters, MAT SC S PR, 3(5-6), 2000, pp. 511-515

Authors: Amimer, K Georgakilas, A Tsagaraki, K Androulidaki, M Cengher, D Toth, L Pecz, B Calamiotou, M
Citation: K. Amimer et al., Single-crystal hexagonal and cubic GaN growth directly on vicinal (001) GaAs substrates by molecular-beam epitaxy, APPL PHYS L, 76(18), 2000, pp. 2580-2582

Authors: Arbiol, J Peiro, F Cornet, A Michelakis, K Georgakilas, A
Citation: J. Arbiol et al., Temperature-graded InAlAs buffers applied on InGaAs/InAlAs/InP high electron mobility transistor heterostructures, J VAC SCI B, 17(6), 1999, pp. 2540-2544

Authors: Michelakis, C Georgakilas, A Androulidaki, M Harteros, K Deligeorgis, G Calamiotou, M Peiro, F Becourt, N Cornet, A Halkias, G
Citation: C. Michelakis et al., Comparison of InGaAs/InAlAs electroabsorption modulator structures on (100) and (111) InP substrates, MAT SCI E B, 66(1-3), 1999, pp. 181-184

Authors: Arbiol, J Peiro, F Cornet, A Morante, JR Michelakis, K Georgakilas, A
Citation: J. Arbiol et al., Comparison of homogeneously grown and temperature-graded InAlAs buffers inthe range 400-560 degrees C: effects on surface morphology and layer stability, THIN SOL FI, 357(1), 1999, pp. 61-65

Authors: Georgakilas, A Androulidaki, M Tsagraki, K Amimer, K Constantinidis, G Pelekanos, NT Calamiotou, M Czigany, Z Pecz, B
Citation: A. Georgakilas et al., Influence of MBE growth temperature on the properties of cubic GaN grown directly on GaAs substrates, PHYS ST S-A, 176(1), 1999, pp. 525-528

Authors: Georgakilas, A Michelakis, K Kayambaki, M Tsagaraki, K Macarona, E Hatzopoulos, Z Vila, A Becourt, N Peiro, F Cornet, A Chrysanthakopoulos, N Calamiotou, M
Citation: A. Georgakilas et al., Material properties of InAlAs layers grown by MBE on vicinal (111)B InP substrates, J CRYST GR, 202, 1999, pp. 248-251

Authors: Lioutas, CB Delimitisi, A Georgakilas, A
Citation: Cb. Lioutas et al., TEM investigation of the dependence of structural defects on prelayer formation in GaAs-on-Si thin films, THIN SOL FI, 336(1-2), 1998, pp. 96-99

Authors: Georgakilas, A Tsagaraki, K Harteros, K Hatzopoulos, Z Vila, A Becourt, N Peiro, F Cornet, A Chrysanthakopoulos, N Calamiotou, M
Citation: A. Georgakilas et al., Correlation between the sign of strain and the surface morphology and defect structure of InAlAs grown on vicinal (111)BInP, THIN SOL FI, 336(1-2), 1998, pp. 218-221
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