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Results:
1-14
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Results: 14
Authors:
Pinnow, CU
Kasko, I
Dehm, C
Jobst, B
Seibt, M
Geyer, U
Citation: Cu. Pinnow et al., Preparation and properties of dc-sputtered IrO2 and Ir thin films for oxygen barrier applications in advanced memory technology, J VAC SCI B, 19(5), 2001, pp. 1857-1865
Authors:
Pinnow, CU
Bicker, M
Geyer, U
Schneider, S
Goerigk, G
Citation: Cu. Pinnow et al., Decomposition and nanocrystallization in reactively sputtered amorphous Ta-Si-N thin films, J APPL PHYS, 90(4), 2001, pp. 1986-1991
Authors:
Rehmet, A
Ratzke, K
Faupel, F
Eversheim, PD
Freitag, K
Geyer, U
Schneider, S
Citation: A. Rehmet et al., Be-7 tracer diffusion in a deeply supercooled Zr46.7Ti8.3Cu7.5Ni10Be27.5 melt, APPL PHYS L, 79(18), 2001, pp. 2892-2894
Authors:
Bicker, M
Pinnow, CU
Geyer, U
Schneider, S
Seibt, M
Citation: M. Bicker et al., Nanocrystallization of amorphous-Ta40Si14N46 diffusion barrier thin films, APPL PHYS L, 78(23), 2001, pp. 3618-3620
Authors:
Rehmet, A
Geyer, U
Citation: A. Rehmet et U. Geyer, Terrace-area distribution and roughness of ion-bombarded single-crystal surfaces, PHYS REV B, 61(11), 2000, pp. 7291-7292
Authors:
Habenicht, S
Bolse, W
Feldermann, H
Geyer, U
Hofsass, H
Lieb, KP
Roccaforte, F
Citation: S. Habenicht et al., Ripple topography of ion-beam-eroded graphite: A key to ion-beam-induced damage tracks, EUROPH LETT, 50(2), 2000, pp. 209-215
Authors:
Habenicht, S
Lieb, KP
Bolse, W
Geyer, U
Roccaforte, F
Ronning, C
Citation: S. Habenicht et al., Ion beam erosion of graphite surfaces studied by STM: Ripples, self-affineroughening and near-surface damage accumulation, NUCL INST B, 161, 2000, pp. 958-962
Authors:
Laudahn, U
Pundt, A
Bicker, M
von Hulsen, U
Geyer, U
Wagner, T
Kirchheim, R
Citation: U. Laudahn et al., Hydrogen-induced stress in Nb single layers, J ALLOY COM, 295, 1999, pp. 490-494
Authors:
Wang, DL
Geyer, U
Citation: Dl. Wang et U. Geyer, Growth of Ni films observed by scanning tunneling microscopy and x-ray, CHIN PHYS L, 16(5), 1999, pp. 370-372
Authors:
Habenicht, S
Bolse, W
Lieb, KP
Reimann, K
Geyer, U
Citation: S. Habenicht et al., Nanometer ripple formation and self-affine roughening of ion-beam-eroded graphite surfaces, PHYS REV B, 60(4), 1999, pp. R2200-R2203
Authors:
Liu, W
Johnson, WL
Schneider, S
Geyer, U
Thiyagarajan, P
Citation: W. Liu et al., Small-angle x-ray-scattering study of phase separation and crystallizationin the bulk amorphous Mg62Cu25Y10Li3 alloy, PHYS REV B, 59(18), 1999, pp. 11755-11759
Authors:
Tang, XP
Geyer, U
Busch, R
Johnson, WL
Wu, Y
Citation: Xp. Tang et al., Diffusion mechanisms in metallic supercooled liquids and glasses, NATURE, 402(6758), 1999, pp. 160-162
Authors:
Laudahn, U
Fahler, S
Krebs, HU
Pundt, A
Bicker, M
Hulsen, UV
Geyer, U
Kirchheim, R
Citation: U. Laudahn et al., Determination of elastic constants in thin films using hydrogen loading, APPL PHYS L, 74(5), 1999, pp. 647-649
Authors:
Wang, DL
Geyer, U
Schneider, S
Citation: Dl. Wang et al., Crystallization of ternary amorphous Ni-Y-Al films observed by scanning tunneling microscopy, CHIN PHYS L, 15(12), 1998, pp. 901-903
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