Authors: Duparre, A Kozhevnikov, I Gliech, S Steinert, J Notni, G

Citation: A. Duparre et al., Surface characterization of optical components for the DUV, VUV and EUV, MICROEL ENG, 57-8, 2001, pp. 65-70

Authors: Kadkhoda, P Muller, A Ristau, D Duparre, A Gliech, S Lauth, H Schuhmann, U Reng, N Tilsch, M Schuhmann, R Amra, C Deumie, C Jolie, C Kessler, H Lindstrom, T Ribbing, CG Bennett, JM

Citation: P. Kadkhoda et al., International round-robin experiment to test the International Organization for Standardization total-scattering draft standard, APPL OPTICS, 39(19), 2000, pp. 3321-3332

Authors: Duparre, A Notni, G Recknagel, RJ Feigl, T Gliech, S

Citation: A. Duparre et al., High resolution topometry in conjunction with macro structures, TEC MES, 66(11), 1999, pp. 437-446