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Authors: Gogineni, U Cressler, JD Niu, G Harame, DL

Citation: U. Gogineni et al., Hot electron and hot hole degradation of UHV/CVD SiGeHBT's, IEEE DEVICE, 47(7), 2000, pp. 1440-1448

Authors: Niu, GF Cressler, JD Gogineni, U Joseph, AJ

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Authors: Niu, GF Cressler, JD Zhang, SM Gogineni, U Ahlgren, DC

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