Authors: Goodman, DL

Citation: Dl. Goodman, Prognostic methodology for deep submicron semiconductor failure modes, IEEE T COMP, 24(1), 2001, pp. 109-111

Authors: Wanderer, AA Bernstein, IL Goodman, DL Nicklas, RA Li, JT Berger, WE Dykewicz, MS Fineman, SM Lee, RE Portnoy, JM Schuller, DE Spector, SL

Citation: Aa. Wanderer et al., The diagnosis and management of urticaria: a practice parameter part I: Acute urticaria/angioedema part II: Chronic urticaria/angioedema - Preface, ANN ALLER A, 85(6), 2000, pp. I

Authors: Goodman, DL Byrne, CA Yen, A Moulton, R Dixon, D Costen, RC

Citation: Dl. Goodman et al., Automated tape placement with in-situ electron beam cure, SAMPE J, 36(2), 2000, pp. 11-17