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Results:
1-8
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Results: 8
Authors:
Gorbunov, GG
Egorova, LV
Es'kov, DN
Taganov, OK
Seregin, AG
Citation: Gg. Gorbunov et al., New applications of Fourier spectrometers, J OPT TECH, 68(8), 2001, pp. 608-612
Authors:
Gorbunov, GG
Grigoryan, VM
Mkrtchyan, GV
Musaelyan, SS
Ovakimyan, SR
Ovchinnikov, AD
Citation: Gg. Gorbunov et al., System for automatically focusing a space-based multichannel Fourier spectrometer, J OPT TECH, 68(2), 2001, pp. 135-137
Authors:
Gorbunov, GG
Perova, TS
Seregin, AG
Citation: Gg. Gorbunov et al., Measurement of thicknesses of thin films by the Fourier spectrometry method, OPT SPECTRO, 90(6), 2001, pp. 887-890
Authors:
Seregin, AG
Gorbunov, GG
Eskov, DN
Citation: Ag. Seregin et al., Wavefront sensor based on a Fourier spectrometer with a multielement detector, J OPT TECH, 67(8), 2000, pp. 773-774
Authors:
Gorbunov, GG
Lazarev, AI
Malyutin, VN
Dzarakyan, AL
Citation: Gg. Gorbunov et al., The MFS-B spectrometric surveillance instrument package, J OPT TECH, 67(5), 2000, pp. 453-458
Authors:
Gorbunov, GG
Moshkin, BE
Citation: Gg. Gorbunov et Be. Moshkin, Fourier spectroradiometers for investigating planetary atmospheres, J OPT TECH, 67(5), 2000, pp. 459-464
Authors:
Gorbunov, GG
Citation: Gg. Gorbunov, Original domestic developments in the area of raster spectroscopy, J OPT TECH, 67(12), 2000, pp. 1072-1074
Authors:
Gorbunov, GG
Shlishevskii, VB
Citation: Gg. Gorbunov et Vb. Shlishevskii, Spectrophotometric apparatus for analyzing and monitoring the quality of aproduct, J OPT TECH, 66(4), 1999, pp. 370-371
Risultati:
1-8
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