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Results:
1-16
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Results: 16
Authors:
Montcalm, C
Spiller, E
Weber, FJ
Wedowski, M
Folta, JA
Gullikson, EM
Citation: C. Montcalm et al., Multilayer coating and test of the optics for two new 10X Microstepper extreme-ultraviolet lithography cameras, J VAC SCI B, 19(4), 2001, pp. 1219-1228
Authors:
Kleineberg, U
Haindl, G
Hutten, A
Reiss, G
Gullikson, EM
Jones, MS
Mrowka, S
Rekawa, SB
Underwood, JH
Citation: U. Kleineberg et al., Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy, APPL PHYS A, 73(4), 2001, pp. 515-519
Authors:
Muramatsu, Y
Ueno, Y
Sasaki, TA
Gullikson, EM
Perera, RCC
Citation: Y. Muramatsu et al., Experimental technique for radiative-process-resolved X-ray absorption spectroscopy at the inner-shell excitation thresholds, J SYNCHROTR, 8, 2001, pp. 369-371
Authors:
Hambach, D
Schneider, G
Gullikson, EM
Citation: D. Hambach et al., Efficient high-order diffraction of extreme-ultraviolet light and soft x-rays by nanostructured volume gratings, OPTICS LETT, 26(15), 2001, pp. 1200-1202
Authors:
Muramatsu, Y
Hirono, S
Umemura, S
Ueno, Y
Hayashi, T
Grush, MM
Gullikson, EM
Perera, RCC
Citation: Y. Muramatsu et al., Soft X-ray emission and absorption spectra in the C K region of sputtered amorphous carbon films, CARBON, 39(9), 2001, pp. 1403-1407
Authors:
Stearns, DG
Gullikson, EM
Citation: Dg. Stearns et Em. Gullikson, Nonspecular scattering from extreme ultraviolet multilayer coatings, PHYSICA B, 283(1-3), 2000, pp. 84-91
Authors:
Naulleau, PP
Cho, CH
Gullikson, EM
Bokor, J
Citation: Pp. Naulleau et al., Transmission phase gratings for EUV interferometry, J SYNCHROTR, 7, 2000, pp. 405-410
Authors:
Muramatsu, Y
Ueno, Y
Hayashi, T
Grush, MM
Gullikson, EM
Perera, RCC
Citation: Y. Muramatsu et al., Soft X-ray emission and absorption spectroscopy of hydrofullerene, J ELEC SPEC, 107(2), 2000, pp. 177-184
Authors:
Lawniczak-Jablonska, K
Suski, T
Gorczyca, I
Christensen, NE
Attenkofer, KE
Perera, RCC
Gullikson, EM
Underwood, JH
Ederer, DL
Weber, ZL
Citation: K. Lawniczak-jablonska et al., Electronic states in valence and conduction bands of group-III nitrides: Experiment and theory, PHYS REV B, 61(24), 2000, pp. 16623-16632
Authors:
Muramatsu, Y
Takenaka, H
Ueno, Y
Gullikson, EM
Perera, RCC
Citation: Y. Muramatsu et al., Chemical bonding state analysis of silicon carbide layers in Mo/SiC/Si multilayer mirrors by soft x-ray emission and absorption spectroscopy, APPL PHYS L, 77(17), 2000, pp. 2653-2655
Authors:
Naulleau, P
Goldberg, KA
Gullikson, EM
Bokor, J
Citation: P. Naulleau et al., At-wavelength, system-level flare characterization of extreme-ultraviolet optical systems, APPL OPTICS, 39(17), 2000, pp. 2941-2947
Authors:
Naulleau, P
Goldberg, KA
Gullikson, EM
Bokor, J
Citation: P. Naulleau et al., Interferometric at-wavelength flare characterization of extreme ultraviolet optical systems, J VAC SCI B, 17(6), 1999, pp. 2987-2991
Authors:
Sacchi, M
Hague, CF
Gota, S
Guiot, E
Gautier-Soyer, M
Pasquali, L
Mrowka, S
Gullikson, EM
Underwood, JH
Citation: M. Sacchi et al., Resonant scattering of polarized soft X-rays for the study of magnetic oxide layers, J ELEC SPEC, 103, 1999, pp. 407-412
Authors:
Sacchi, M
Mirone, A
Hague, CF
Mariot, JM
Pasquali, L
Isberg, P
Gullikson, EM
Underwood, JH
Citation: M. Sacchi et al., Soft-x-ray resonant scattering from V/Fe (001) magnetic superlattices, PHYS REV B, 60(18), 1999, pp. R12569-R12572
Authors:
Gullikson, EM
Stearns, DG
Citation: Em. Gullikson et Dg. Stearns, Asymmetric extreme ultraviolet scattering from sputter-deposited multilayers, PHYS REV B, 59(20), 1999, pp. 13273-13277
Authors:
Attwood, DT
Naulleau, P
Goldberg, KA
Tejnil, E
Chang, C
Beguiristain, R
Batson, P
Bokor, J
Gullikson, EM
Koike, M
Medecki, H
Underwood, JH
Citation: Dt. Attwood et al., Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions, IEEE J Q EL, 35(5), 1999, pp. 709-720
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