Authors:
Guo, BN
El Bouanani, M
Renfrow, SN
Nigam, M
Walsh, DS
Doyle, BL
Duggan, JL
McDaniel, FD
Citation: Bn. Guo et al., Diffusion-time-resolved ion-beam-induced charge collection from stripe-like test junctions induced by heavy-ion microbeams, NUCL INST B, 181, 2001, pp. 315-319
Authors:
Datar, SA
Wu, LY
Guo, BN
Nigam, M
Necsoiu, D
Zhai, YJ
Smith, DE
Yang, C
Bouanani, ME
Lee, JJ
McDaniel, FD
Citation: Sa. Datar et al., High sensitivity measurement of implanted As in the presence of Ge in GexSi1-x/Si layered alloys using trace element accelerator mass spectrometry, APPL PHYS L, 77(24), 2000, pp. 3974-3976
Authors:
McDaniel, FD
Guo, BN
Renfrow, SN
El Bouanani, M
Duggan, JL
Doyle, BL
Walsh, DS
Aton, TJ
Citation: Fd. Mcdaniel et al., Ion beam Induced charge collection (IBICC) of integrated circuits using a 10 MeV carbon microbeam, NUCL INST B, 158(1-4), 1999, pp. 264-269