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Results:
1-12
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Results: 12
Authors:
POGANY D
SELIGER N
LALINSKY T
KUZMIK J
HABAS P
HRKUT P
GORNIK E
Citation: D. Pogany et al., STUDY OF THERMAL EFFECTS IN GAAS MICROMACHINED POWER SENSOR MICROSYSTEMS BY AN OPTICAL INTERFEROMETER TECHNIQUE, Microelectronics, 29(4-5), 1998, pp. 191-198
Authors:
SELIGER N
HABAS P
POGANY D
GORNIK E
Citation: N. Seliger et al., TIME-RESOLVED ANALYSIS OF SELF-HEATING IN POWER VDMOSFETS USING BACKSIDE LASERPROBING, Solid-state electronics, 41(9), 1997, pp. 1285-1292
Authors:
SELIGER N
POGANY D
FURBOCK C
HABAS P
GORNIK E
STOISIEK M
Citation: N. Seliger et al., A LASER-BEAM METHOD FOR EVALUATION OF THERMAL TIME CONSTANT IN SMART POWER DEVICES, Microelectronics and reliability, 37(10-11), 1997, pp. 1727-1730
Authors:
SELIGER N
HABAS P
GORNIK E
Citation: N. Seliger et al., A STUDY OF BACKSIDE LASER-PROBE SIGNALS IN MOSFETS, Microelectronic engineering, 31(1-4), 1996, pp. 87-94
Authors:
BELLENS R
VANDENBOSCH G
HABAS P
MIEVILLE JP
BADENES G
CLERIX A
GROESENEKEN G
DEFERM L
MAES HE
Citation: R. Bellens et al., PERFORMANCE AND RELIABILITY ASPECTS OF FOND - A NEW DEEP-SUBMICRON CMOS DEVICE CONCEPT, I.E.E.E. transactions on electron devices, 43(9), 1996, pp. 1407-1415
Authors:
HABAS P
PRIJIC Z
PANTIC D
STOJADINOVIC ND
Citation: P. Habas et al., CHARGE-PUMPING CHARACTERIZATION OF SIO2 SI INTERFACE IN VIRGIN AND IRRADIATED POWER VDMOSFETS/, I.E.E.E. transactions on electron devices, 43(12), 1996, pp. 2197-2209
Authors:
HABAS P
PRIJIC Z
PANTIC D
Citation: P. Habas et al., THE APPLICATION OF CHARGE-PUMPING TECHNIQUE TO CHARACTERIZE THE SI SIO2 INTERFACE IN POWER VDMOSFETS/, Microelectronic engineering, 28(1-4), 1995, pp. 171-174
Authors:
BELLENS R
HABAS P
GROESENEKEN G
MAES HE
MIEVILLE JP
VANDENBOSCH G
DEFERM L
Citation: R. Bellens et al., STUDY OF THE HOT-CARRIER DEGRADATION PERFORMANCE OF 0.35-MU-M FULLY OVERLAPPED LDD-DEVICES, Microelectronic engineering, 28(1-4), 1995, pp. 265-268
Authors:
HABAS P
BELLENS R
GROESENEKEN G
Citation: P. Habas et al., A MODEL STUDY OF THE HOT-CARRIER PROBLEM IN LDD-MOSFETS AND OVERLAPPED LDD-MOSFETS, Microelectronic engineering, 28(1-4), 1995, pp. 285-288
Authors:
HABAS P
Citation: P. Habas, CHARGE-PUMPING CHARACTERISTICS OF VIRGIN AND STRESSED LIGHTLY-DOPED DRAIN MOSFETS, Solid-state electronics, 38(4), 1995, pp. 891-904
Authors:
HABAS P
Citation: P. Habas, MODELING STUDY OF THE EXPERIMENTAL-TECHNIQUES FOR THE CHARACTERIZATION OF MOSFET HOT-CARRIER AGING, Microelectronics and reliability, 35(7), 1995, pp. 1073-1104
Authors:
HABAS P
Citation: P. Habas, MODELING STUDY OF THE EXPERIMENTAL-TECHNIQUES FOR THE CHARACTERIZATION OF MOSFET HOT-CARRIER AGING, Microelectronics and reliability, 35(3), 1995, pp. 481-510
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