Authors: AZIM M HARLAND CJ MARTIN TJ MILNE RH VENABLES JA

Citation: M. Azim et al., CESIUM ON SI(100) STUDIED BY BIASSED SECONDARY-ELECTRON MICROSCOPY, Scanning microscopy, 7(4), 1993, pp. 1153-1160

Authors: HUANG M HARLAND CJ VENABLES JA

Citation: M. Huang et al., DEVELOPMENT OF AN ANGLE-RESOLVING ELECTRON SPECTROMETER, Surface and interface analysis, 20(8), 1993, pp. 666-674

Authors: MILNE RH HEMBREE GG DRUKER JS HARLAND CJ VENABLES JA

Citation: Rh. Milne et al., SURFACE STUDIES IN UHV SEM AND STEM (VOL 170, PG 193, 1993), Journal of Microscopy, 171, 1993, pp. 274-274

Authors: MILNE RH HEMBREE GG DRUCKER JS HARLAND CJ VENABLES JA

Citation: Rh. Milne et al., SURFACE STUDIES IN UHV SEM AND STEM, Journal of Microscopy, 170, 1993, pp. 193-199