Authors:
BEILENHOFF K
KLINGBEIL H
HEINRICH W
HARTNAGEL HL
Citation: K. Beilenhoff et al., OPEN AND SHORT CIRCUITS IN COPLANAR MMICS, IEEE transactions on microwave theory and techniques, 41(9), 1993, pp. 1534-1537
Citation: A. Jelenski et al., NEW APPROACH TO THE DESIGN AND THE FABRICATION OF THZ SCHOTTKY-BARRIER DIODES, IEEE transactions on microwave theory and techniques, 41(4), 1993, pp. 549-557
Citation: K. Fricke et al., ALGAAS GAAS HBT FOR HIGH-TEMPERATURE APPLICATION - REPLY/, I.E.E.E. transactions on electron devices, 40(9), 1993, pp. 1717-1718
Citation: K. Bock et Hl. Hartnagel, PROPOSAL FOR THE CONCEPT OF ULTRADENSE INTEGRATED MEMORIES BASED ON COULOMB-BLOCKADE AT ROOM-TEMPERATURE, Electronics Letters, 29(25), 1993, pp. 2228-2230
Citation: I. Aller et Hl. Hartnagel, INP EXPOSURE TO HYDROGEN PLASMA WITH DC POTENTIAL CONTROL, Journal of the Electrochemical Society, 140(9), 1993, pp. 2715-2720
Authors:
DASGUPTA N
RIEMENSCHNEIDER R
HARTNAGEL HL
Citation: N. Dasgupta et al., ELECTROCHEMICAL CAPACITANCE-VOLTAGE PROFILING - A NEW TECHNIQUE TO STUDY PLASMA DAMAGE DURING A PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION, Journal of the Electrochemical Society, 140(7), 1993, pp. 2038-2041