Citation: Na. Hegab et al., EFFECT OF ANNEALING ON THE OPTICAL-PROPERTIES OF IN2TE3 THIN-FILMS, Applied physics A: Materials science & processing, 66(2), 1998, pp. 235-240
Citation: Mm. Elsamanoudy et al., CONDUCTION MECHANISM IN THE PRE-SWITCHING STATE OF THIN-FILMS CONTAINING TE AS GE SI, Vacuum, 46(7), 1995, pp. 701-707
Citation: Na. Hegab et al., PREPARATION AND INVESTIGATION ON GLASSES IN THE TE46AS32GE10SI12 AND TE41AS37GE10SI12 SYSTEMS, Journal of Materials Science, 30(21), 1995, pp. 5461-5465
Authors:
AFIFI MA
LABIB HH
HEGAB NA
FADEL M
BEKHEET AE
Citation: Ma. Afifi et al., MEMORY SWITCHING CHARACTERISTICS OF IN2SE3 AMORPHOUS THIN-FILMS, Indian Journal of Pure & Applied Physics, 33(3), 1995, pp. 129-134