Authors: HEIECK J

Citation: J. Heieck, SPECTRALLY RESOLVED MEASUREMENTS OF RECIPROCITY FAILURE, Journal of information recording, 23(3), 1996, pp. 233-248

Authors: HEIECK J

Citation: J. Heieck, IONIC-CONDUCTIVITY IN AGBR AGI MICROCRYSTALS, Journal of information recording, 22(4), 1996, pp. 373-385

Authors: HAILSTONE RK HEIECK J

Citation: Rk. Hailstone et J. Heieck, COMPUTER-SIMULATION OF PHOTOCONDUCTIVITY DECAY IN AGBR MICROCRYSTALS - A 2-CENTER MODEL, Journal of physics. D, Applied physics, 28(2), 1995, pp. 375-383

Authors: GIEB M HEIECK J SCHULE W

Citation: M. Gieb et al., RADIATION-ENHANCED DIFFUSION IN NICKEL-10.6-PERCENT CHROMIUM-ALLOYS, Journal of nuclear materials, 225, 1995, pp. 85-96

Authors: HEIECK J GRANZER F

Citation: J. Heieck et F. Granzer, A CRITICAL-EXAMINATION OF MODELS FOR THE INTERPRETATION OF DIELECTRICLOSS MEASUREMENTS IN PHOTOGRAPHY, Journal of imaging science and technology, 38(5), 1994, pp. 464-474