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Results: 1-25 | 26-37 |
Results: 26-37/37
RESOLVING FLUORESCENCE BEADS AT 100-200 NM AXIAL DISTANCE WITH A 2-PHOTON 4PI-MICROSCOPE OPERATING IN THE NEAR-INFRARED
Authors: HELL SW SCHRADER M HANNINEN PE SOINI E
Citation: Sw. Hell et al., RESOLVING FLUORESCENCE BEADS AT 100-200 NM AXIAL DISTANCE WITH A 2-PHOTON 4PI-MICROSCOPE OPERATING IN THE NEAR-INFRARED, Optics communications, 120(3-4), 1995, pp. 129-133
ANNULAR APERTURE 2-PHOTON EXCITATION MICROSCOPY
Authors: HELL SW HANNINEN PE KUUSISTO A SCHRADER M SOINI E
Citation: Sw. Hell et al., ANNULAR APERTURE 2-PHOTON EXCITATION MICROSCOPY, Optics communications, 117(1-2), 1995, pp. 20-24
STIMULATED-EMISSION ON MICROSCOPIC SCALE - LIGHT QUENCHING OF PYRIDINE-2 USING A TI-SAPPHIRE LASER
Authors: HELL SW SCHRADER M BAHLMANN K MEINECKE F LAKOWICZ JR GRYCZYNSKI I
Citation: Sw. Hell et al., STIMULATED-EMISSION ON MICROSCOPIC SCALE - LIGHT QUENCHING OF PYRIDINE-2 USING A TI-SAPPHIRE LASER, Journal of Microscopy, 180, 1995, pp. 1-2
2-PHOTON EXCITATION 4PI CONFOCAL MICROSCOPE - ENHANCED AXIAL RESOLUTION MICROSCOPE FOR BIOLOGICAL-RESEARCH
Authors: HANNINEN PE HELL SW SALO J SOINI E CREMER C
Citation: Pe. Hanninen et al., 2-PHOTON EXCITATION 4PI CONFOCAL MICROSCOPE - ENHANCED AXIAL RESOLUTION MICROSCOPE FOR BIOLOGICAL-RESEARCH, Applied physics letters, 66(13), 1995, pp. 1698-1700
ENHANCING THE AXIAL RESOLUTION IN FAR-FIELD LIGHT-MICROSCOPY - 2-PHOTON 4PI CONFOCAL FLUORESCENCE MICROSCOPY
Authors: HELL SW LINDEK S STELZER EHK
Citation: Sw. Hell et al., ENHANCING THE AXIAL RESOLUTION IN FAR-FIELD LIGHT-MICROSCOPY - 2-PHOTON 4PI CONFOCAL FLUORESCENCE MICROSCOPY, J. mod. opt., 41(4), 1994, pp. 675-681
CONFOCAL MICROSCOPY WITH AN INCREASED DETECTION APERTURE - TYPE-B 4PICONFOCAL MICROSCOPY
Authors: HELL SW STELZER EHK LINDEK S CREMER C
Citation: Sw. Hell et al., CONFOCAL MICROSCOPY WITH AN INCREASED DETECTION APERTURE - TYPE-B 4PICONFOCAL MICROSCOPY, Optics letters, 19(3), 1994, pp. 222-224
BREAKING THE DIFFRACTION RESOLUTION LIMIT BY STIMULATED-EMISSION - STIMULATED-EMISSION-DEPLETION FLUORESCENCE MICROSCOPY
Authors: HELL SW WICHMANN J
Citation: Sw. Hell et J. Wichmann, BREAKING THE DIFFRACTION RESOLUTION LIMIT BY STIMULATED-EMISSION - STIMULATED-EMISSION-DEPLETION FLUORESCENCE MICROSCOPY, Optics letters, 19(11), 1994, pp. 780-782
PULSED AND CW CONFOCAL MICROSCOPY - A COMPARISON OF RESOLUTION AND CONTRAST
Authors: HELL SW HANNINEN PE SALO J KUUSISTO A SOINI E WILSON T TAN JB
Citation: Sw. Hell et al., PULSED AND CW CONFOCAL MICROSCOPY - A COMPARISON OF RESOLUTION AND CONTRAST, Optics communications, 113(1-3), 1994, pp. 144-152
IMPROVEMENT OF LATERAL RESOLUTION IN FAR-FIELD FLUORESCENCE LIGHT-MICROSCOPY BY USING 2-PHOTON EXCITATION WITH OFFSET BEAMS
Authors: HELL SW
Citation: Sw. Hell, IMPROVEMENT OF LATERAL RESOLUTION IN FAR-FIELD FLUORESCENCE LIGHT-MICROSCOPY BY USING 2-PHOTON EXCITATION WITH OFFSET BEAMS, Optics communications, 106(1-3), 1994, pp. 19-24
CONTINUOUS-WAVE EXCITATION 2-PHOTON FLUORESCENCE MICROSCOPY
Authors: HANNINEN PE SOINI E HELL SW
Citation: Pe. Hanninen et al., CONTINUOUS-WAVE EXCITATION 2-PHOTON FLUORESCENCE MICROSCOPY, Journal of Microscopy, 176, 1994, pp. 222-225
REFRACTIVE-INDEX-INDUCED ABERRATIONS IN 2-PHOTON CONFOCAL FLUORESCENCE MICROSCOPY
Authors: JACOBSEN H HANNINEN P SOINI E HELL SW
Citation: H. Jacobsen et al., REFRACTIVE-INDEX-INDUCED ABERRATIONS IN 2-PHOTON CONFOCAL FLUORESCENCE MICROSCOPY, Journal of Microscopy, 176, 1994, pp. 226-230
MEASUREMENT OF THE 4PI-CONFOCAL POINT-SPREAD FUNCTION PROVES 75 NM AXIAL RESOLUTION
Authors: HELL SW LINDEK S CREMER C STELZER EHK
Citation: Sw. Hell et al., MEASUREMENT OF THE 4PI-CONFOCAL POINT-SPREAD FUNCTION PROVES 75 NM AXIAL RESOLUTION, Applied physics letters, 64(11), 1994, pp. 1335-1337
Risultati: 1-25 | 26-37 |